Vector-analyzer interference device for MEASURement of DIELECTRIC permittivity of MATERIALS

Vector-analyzer interference device for measurement of dielectric permittivity of materials comprising arranged consequently light source, the input focusing lens, polarizer, and placed consistently analyzer, output focusing lens, and the radiation detector, moreover between the polarizer and analyz...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Yaschyshyn Yevhen Mykhailovych, Kushnir Oleh Stepanovych, Godziszewski Konrad, Andruschak Anatolii Stepanovych, Andruschak Nazarii Anatoliiovych
Format:	Patent
Sprache:	eng ; rus ; ukr
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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