SYSTEM FOR THERMAL-CYCLE TESTS OF MATERIALS

The proposed system for thermal-cycle tests of materials contains an elliptic heating chamber, a heating element, which is installed at one of the focal points of the ellipse, a sample holder, which is installed at the second focal point of the ellipse, and an elliptic cooling chamber, which is conn...

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Bibliographische Detailangaben
Hauptverfasser:	DOLHOV MYKOLA ANATOLIIOVYCH, SOLOVYKH YEVHEN KOSTIANTYNOVYCH, IVANCHENKO OLEKSANDR VASYLIOVYCH, LIASHENKO BORYS ARTEMOVYCH
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The proposed system for thermal-cycle tests of materials contains an elliptic heating chamber, a heating element, which is installed at one of the focal points of the ellipse, a sample holder, which is installed at the second focal point of the ellipse, and an elliptic cooling chamber, which is connected with the heating chamber. The focal point with the sample holder is common for the heating chamber and the cooling chamber. In the chambers, dampers are installed that are used for setting the heating or cooling mode of the sample. To changing the positions of the dampers in transition from the heating mode to the cooling mode and vice versa, a special articulation linkage is used.