OPTOELECTRONIC DEVICE FOR MEASURING GAS FLOW RATE

The proposed optoelectronic device for measuring gas flow rate contains an optical radiation source, a semitransparent plate, a reflector, a restrictor, a transparent cuvette, a position transducer, and a computing unit.

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1. Verfasser: BILYNSKYI YOSYP YOSYPOVYCH
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creator BILYNSKYI YOSYP YOSYPOVYCH
description The proposed optoelectronic device for measuring gas flow rate contains an optical radiation source, a semitransparent plate, a reflector, a restrictor, a transparent cuvette, a position transducer, and a computing unit.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_UA19734UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>UA19734UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_UA19734UU3</originalsourceid><addsrcrecordid>eNrjZDD0Dwjxd_VxdQ4J8vfzdFZwcQ3zdHZVcPMPUvB1dQwODfL0c1dwdwxWcPPxD1cIcgxx5WFgTUvMKU7lhdLcDHJuriHOHrqpBfnxqcUFicmpeakl8aGOhpbmxiahocYEFQAAhAYlyQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>OPTOELECTRONIC DEVICE FOR MEASURING GAS FLOW RATE</title><source>esp@cenet</source><creator>BILYNSKYI YOSYP YOSYPOVYCH</creator><creatorcontrib>BILYNSKYI YOSYP YOSYPOVYCH</creatorcontrib><description>The proposed optoelectronic device for measuring gas flow rate contains an optical radiation source, a semitransparent plate, a reflector, a restrictor, a transparent cuvette, a position transducer, and a computing unit.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20061215&amp;DB=EPODOC&amp;CC=UA&amp;NR=19734U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20061215&amp;DB=EPODOC&amp;CC=UA&amp;NR=19734U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BILYNSKYI YOSYP YOSYPOVYCH</creatorcontrib><title>OPTOELECTRONIC DEVICE FOR MEASURING GAS FLOW RATE</title><description>The proposed optoelectronic device for measuring gas flow rate contains an optical radiation source, a semitransparent plate, a reflector, a restrictor, a transparent cuvette, a position transducer, and a computing unit.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD0Dwjxd_VxdQ4J8vfzdFZwcQ3zdHZVcPMPUvB1dQwODfL0c1dwdwxWcPPxD1cIcgxx5WFgTUvMKU7lhdLcDHJuriHOHrqpBfnxqcUFicmpeakl8aGOhpbmxiahocYEFQAAhAYlyQ</recordid><startdate>20061215</startdate><enddate>20061215</enddate><creator>BILYNSKYI YOSYP YOSYPOVYCH</creator><scope>EVB</scope></search><sort><creationdate>20061215</creationdate><title>OPTOELECTRONIC DEVICE FOR MEASURING GAS FLOW RATE</title><author>BILYNSKYI YOSYP YOSYPOVYCH</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_UA19734UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>BILYNSKYI YOSYP YOSYPOVYCH</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BILYNSKYI YOSYP YOSYPOVYCH</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>OPTOELECTRONIC DEVICE FOR MEASURING GAS FLOW RATE</title><date>2006-12-15</date><risdate>2006</risdate><abstract>The proposed optoelectronic device for measuring gas flow rate contains an optical radiation source, a semitransparent plate, a reflector, a restrictor, a transparent cuvette, a position transducer, and a computing unit.</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title OPTOELECTRONIC DEVICE FOR MEASURING GAS FLOW RATE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T15%3A55%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=BILYNSKYI%20YOSYP%20YOSYPOVYCH&rft.date=2006-12-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUA19734UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true