Drawer type burn-in socket
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| creator | SUN, WEIIH CHANG, WEN-HSU LIU, SHAOI |
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| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TWM638140UU</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TWM638140UU</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TWM638140UU3</originalsourceid><addsrcrecordid>eNrjZJByKUosTy1SKKksSFVIKi3K083MUyjOT85OLeFhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfEh4b5mxhaGJgahocZEKAEABggjNg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Drawer type burn-in socket</title><source>esp@cenet</source><creator>SUN, WEIIH ; CHANG, WEN-HSU ; LIU, SHAOI</creator><creatorcontrib>SUN, WEIIH ; CHANG, WEN-HSU ; LIU, SHAOI</creatorcontrib><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230301&DB=EPODOC&CC=TW&NR=M638140U$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25566,76549</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230301&DB=EPODOC&CC=TW&NR=M638140U$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SUN, WEIIH</creatorcontrib><creatorcontrib>CHANG, WEN-HSU</creatorcontrib><creatorcontrib>LIU, SHAOI</creatorcontrib><title>Drawer type burn-in socket</title><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJByKUosTy1SKKksSFVIKi3K083MUyjOT85OLeFhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfEh4b5mxhaGJgahocZEKAEABggjNg</recordid><startdate>20230301</startdate><enddate>20230301</enddate><creator>SUN, WEIIH</creator><creator>CHANG, WEN-HSU</creator><creator>LIU, SHAOI</creator><scope>EVB</scope></search><sort><creationdate>20230301</creationdate><title>Drawer type burn-in socket</title><author>SUN, WEIIH ; CHANG, WEN-HSU ; LIU, SHAOI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TWM638140UU3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SUN, WEIIH</creatorcontrib><creatorcontrib>CHANG, WEN-HSU</creatorcontrib><creatorcontrib>LIU, SHAOI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SUN, WEIIH</au><au>CHANG, WEN-HSU</au><au>LIU, SHAOI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Drawer type burn-in socket</title><date>2023-03-01</date><risdate>2023</risdate><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
| recordid | cdi_epo_espacenet_TWM638140UU |
| source | esp@cenet |
| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Drawer type burn-in socket |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-18T02%3A27%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SUN,%20WEIIH&rft.date=2023-03-01&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ETWM638140UU%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |