Automated optical inspection method, automated optical inspection system and storage medium

An automated optical inspection method, an automated optical inspection system, and a storage medium are provided. The method includes the following. An original image including first images of a target object is captured by an optical lens. An edge detection is performed on the original image to ob...

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Hauptverfasser: LEE, CHIA-YEH, GU, CHENG-WEI, WANG, SHANGI
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creator LEE, CHIA-YEH
GU, CHENG-WEI
WANG, SHANGI
description An automated optical inspection method, an automated optical inspection system, and a storage medium are provided. The method includes the following. An original image including first images of a target object is captured by an optical lens. An edge detection is performed on the original image to obtain an edge image including second images having an edge pattern. At least one of maximum, minimum, and average values of a pixel value in the second images is calculated. The edge image is divided into image blocks according to a unit area, and characteristic values are calculated according to the at least one of the maximum, minimum, and average values corresponding to the second images included in the image blocks. An optimal regression model is obtained by training a regression model corresponding to a defect of the target object according to the characteristic values and a data of the target object.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TWI798650BB</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TWI798650BB</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TWI798650BB3</originalsourceid><addsrcrecordid>eNrjZIh2LC3Jz00sSU1RyC8oyUxOzFHIzCsuSE0uyczPU8hNLcnIT9FRSMSnqLiyuCQ1VyExL0WhuCS_KDE9FagvJbM0l4eBNS0xpziVF0pzMyi4uYY4e-imFuTHpxYXJCan5qWWxIeEe5pbWpiZGjg5GROhBAByuDxl</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Automated optical inspection method, automated optical inspection system and storage medium</title><source>esp@cenet</source><creator>LEE, CHIA-YEH ; GU, CHENG-WEI ; WANG, SHANGI</creator><creatorcontrib>LEE, CHIA-YEH ; GU, CHENG-WEI ; WANG, SHANGI</creatorcontrib><description>An automated optical inspection method, an automated optical inspection system, and a storage medium are provided. The method includes the following. An original image including first images of a target object is captured by an optical lens. An edge detection is performed on the original image to obtain an edge image including second images having an edge pattern. At least one of maximum, minimum, and average values of a pixel value in the second images is calculated. The edge image is divided into image blocks according to a unit area, and characteristic values are calculated according to the at least one of the maximum, minimum, and average values corresponding to the second images included in the image blocks. An optimal regression model is obtained by training a regression model corresponding to a defect of the target object according to the characteristic values and a data of the target object.</description><language>chi ; eng</language><subject>AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUSPOLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE ; APPARATUS THEREFOR ; CALCULATING ; CHEMISTRY ; COMPUTING ; COUNTING ; CRYSTAL GROWTH ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; METALLURGY ; PHYSICS ; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE ; REFINING BY ZONE-MELTING OF MATERIAL ; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE ; SINGLE-CRYSTAL-GROWTH ; TESTING ; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL ORUNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230411&amp;DB=EPODOC&amp;CC=TW&amp;NR=I798650B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230411&amp;DB=EPODOC&amp;CC=TW&amp;NR=I798650B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LEE, CHIA-YEH</creatorcontrib><creatorcontrib>GU, CHENG-WEI</creatorcontrib><creatorcontrib>WANG, SHANGI</creatorcontrib><title>Automated optical inspection method, automated optical inspection system and storage medium</title><description>An automated optical inspection method, an automated optical inspection system, and a storage medium are provided. The method includes the following. An original image including first images of a target object is captured by an optical lens. An edge detection is performed on the original image to obtain an edge image including second images having an edge pattern. At least one of maximum, minimum, and average values of a pixel value in the second images is calculated. The edge image is divided into image blocks according to a unit area, and characteristic values are calculated according to the at least one of the maximum, minimum, and average values corresponding to the second images included in the image blocks. An optimal regression model is obtained by training a regression model corresponding to a defect of the target object according to the characteristic values and a data of the target object.</description><subject>AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUSPOLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE</subject><subject>APPARATUS THEREFOR</subject><subject>CALCULATING</subject><subject>CHEMISTRY</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>CRYSTAL GROWTH</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>METALLURGY</subject><subject>PHYSICS</subject><subject>PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE</subject><subject>REFINING BY ZONE-MELTING OF MATERIAL</subject><subject>SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE</subject><subject>SINGLE-CRYSTAL-GROWTH</subject><subject>TESTING</subject><subject>UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL ORUNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZIh2LC3Jz00sSU1RyC8oyUxOzFHIzCsuSE0uyczPU8hNLcnIT9FRSMSnqLiyuCQ1VyExL0WhuCS_KDE9FagvJbM0l4eBNS0xpziVF0pzMyi4uYY4e-imFuTHpxYXJCan5qWWxIeEe5pbWpiZGjg5GROhBAByuDxl</recordid><startdate>20230411</startdate><enddate>20230411</enddate><creator>LEE, CHIA-YEH</creator><creator>GU, CHENG-WEI</creator><creator>WANG, SHANGI</creator><scope>EVB</scope></search><sort><creationdate>20230411</creationdate><title>Automated optical inspection method, automated optical inspection system and storage medium</title><author>LEE, CHIA-YEH ; GU, CHENG-WEI ; WANG, SHANGI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TWI798650BB3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2023</creationdate><topic>AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUSPOLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE</topic><topic>APPARATUS THEREFOR</topic><topic>CALCULATING</topic><topic>CHEMISTRY</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>CRYSTAL GROWTH</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>METALLURGY</topic><topic>PHYSICS</topic><topic>PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE</topic><topic>REFINING BY ZONE-MELTING OF MATERIAL</topic><topic>SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE</topic><topic>SINGLE-CRYSTAL-GROWTH</topic><topic>TESTING</topic><topic>UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL ORUNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL</topic><toplevel>online_resources</toplevel><creatorcontrib>LEE, CHIA-YEH</creatorcontrib><creatorcontrib>GU, CHENG-WEI</creatorcontrib><creatorcontrib>WANG, SHANGI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LEE, CHIA-YEH</au><au>GU, CHENG-WEI</au><au>WANG, SHANGI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Automated optical inspection method, automated optical inspection system and storage medium</title><date>2023-04-11</date><risdate>2023</risdate><abstract>An automated optical inspection method, an automated optical inspection system, and a storage medium are provided. The method includes the following. An original image including first images of a target object is captured by an optical lens. An edge detection is performed on the original image to obtain an edge image including second images having an edge pattern. At least one of maximum, minimum, and average values of a pixel value in the second images is calculated. The edge image is divided into image blocks according to a unit area, and characteristic values are calculated according to the at least one of the maximum, minimum, and average values corresponding to the second images included in the image blocks. An optimal regression model is obtained by training a regression model corresponding to a defect of the target object according to the characteristic values and a data of the target object.</abstract><oa>free_for_read</oa></addata></record>
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language chi ; eng
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subjects AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUSPOLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE
APPARATUS THEREFOR
CALCULATING
CHEMISTRY
COMPUTING
COUNTING
CRYSTAL GROWTH
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
METALLURGY
PHYSICS
PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE
REFINING BY ZONE-MELTING OF MATERIAL
SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITHDEFINED STRUCTURE
SINGLE-CRYSTAL-GROWTH
TESTING
UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL ORUNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL
title Automated optical inspection method, automated optical inspection system and storage medium
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