TWI783368B
The present disclosure proposes a diagnostic system capable of properly identifying the cause of even an error for which multiple factors or multiple compound factors may be accountable. The diagnostic system according to the present disclosure is provided with a learning device for learning at leas...
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| creator | ISHIKAWA, MASAYOSHI UEDA, KAZUHIRO TAKANO, MASAMI YOSHIDA, YASUHIRO SASAJIMA, FUMIHIRO |
| description | The present disclosure proposes a diagnostic system capable of properly identifying the cause of even an error for which multiple factors or multiple compound factors may be accountable. The diagnostic system according to the present disclosure is provided with a learning device for learning at least one of a recipe defining operations of an inspection device, log data describing states of the device, or specimen data describing characteristics of a specimen in association with error types of the device, and estimates the cause of the error by using the learning device (refer to FIG. 4). |
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The diagnostic system according to the present disclosure is provided with a learning device for learning at least one of a recipe defining operations of an inspection device, log data describing states of the device, or specimen data describing characteristics of a specimen in association with error types of the device, and estimates the cause of the error by using the learning device (refer to FIG. 4).</description><language>chi</language><subject>BASIC ELECTRIC ELEMENTS ; CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; PHYSICS</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221111&DB=EPODOC&CC=TW&NR=I783368B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20221111&DB=EPODOC&CC=TW&NR=I783368B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ISHIKAWA, MASAYOSHI</creatorcontrib><creatorcontrib>UEDA, KAZUHIRO</creatorcontrib><creatorcontrib>TAKANO, MASAMI</creatorcontrib><creatorcontrib>YOSHIDA, YASUHIRO</creatorcontrib><creatorcontrib>SASAJIMA, FUMIHIRO</creatorcontrib><title>TWI783368B</title><description>The present disclosure proposes a diagnostic system capable of properly identifying the cause of even an error for which multiple factors or multiple compound factors may be accountable. The diagnostic system according to the present disclosure is provided with a learning device for learning at least one of a recipe defining operations of an inspection device, log data describing states of the device, or specimen data describing characteristics of a specimen in association with error types of the device, and estimates the cause of the error by using the learning device (refer to FIG. 4).</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZOAKCfc0tzA2NrNw4mFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8QgNTsZEKAEADu4bmg</recordid><startdate>20221111</startdate><enddate>20221111</enddate><creator>ISHIKAWA, MASAYOSHI</creator><creator>UEDA, KAZUHIRO</creator><creator>TAKANO, MASAMI</creator><creator>YOSHIDA, YASUHIRO</creator><creator>SASAJIMA, FUMIHIRO</creator><scope>EVB</scope></search><sort><creationdate>20221111</creationdate><title>TWI783368B</title><author>ISHIKAWA, MASAYOSHI ; UEDA, KAZUHIRO ; TAKANO, MASAMI ; YOSHIDA, YASUHIRO ; SASAJIMA, FUMIHIRO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TWI783368BB3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi</language><creationdate>2022</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>ISHIKAWA, MASAYOSHI</creatorcontrib><creatorcontrib>UEDA, KAZUHIRO</creatorcontrib><creatorcontrib>TAKANO, MASAMI</creatorcontrib><creatorcontrib>YOSHIDA, YASUHIRO</creatorcontrib><creatorcontrib>SASAJIMA, FUMIHIRO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ISHIKAWA, MASAYOSHI</au><au>UEDA, KAZUHIRO</au><au>TAKANO, MASAMI</au><au>YOSHIDA, YASUHIRO</au><au>SASAJIMA, FUMIHIRO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TWI783368B</title><date>2022-11-11</date><risdate>2022</risdate><abstract>The present disclosure proposes a diagnostic system capable of properly identifying the cause of even an error for which multiple factors or multiple compound factors may be accountable. The diagnostic system according to the present disclosure is provided with a learning device for learning at least one of a recipe defining operations of an inspection device, log data describing states of the device, or specimen data describing characteristics of a specimen in association with error types of the device, and estimates the cause of the error by using the learning device (refer to FIG. 4).</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY PHYSICS |
| title | TWI783368B |
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