Probe positioning carrier
The present invention provides a probe positioning carrier, which includes an insulating seat and a magnetic unit that is embedded in the insulating seat. The insulating seat has a first end surface and a limiting slot that is recessed in the first end surface. The magnetic unit has a first magnetic...
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creator | Lai, Yi-Hsin Lin, Jia-Chuan Lee, Ching-Hsien Huang, Yu-Chen Jiang, Tai-Lin Tung, Wei-Shao |
description | The present invention provides a probe positioning carrier, which includes an insulating seat and a magnetic unit that is embedded in the insulating seat. The insulating seat has a first end surface and a limiting slot that is recessed in the first end surface. The magnetic unit has a first magnetic end and a second magnetic end that is arranged opposite to the first magnetic, and the second magnetic end has a magnetism opposite to that of the first magnetic end. The first magnetic end is arranged adjacent to the limiting slot, and a distance between the first magnetic end and a bottom of the limiting slot is less than or equal to 3mm. The insulating seat allows a pin to insert into the limiting slot in a point contact manner, and the first magnetic end can be magnetically attracted with the pin, thereby maintaining the pin to be erected with respect to the first magnetic end. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TWI767876BB</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TWI767876BB</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TWI767876BB3</originalsourceid><addsrcrecordid>eNrjZJAMKMpPSlUoyC_OLMnMz8vMS1dITiwqykwt4mFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8SHhnuZm5hbmZk5OxkQoAQD_yyMP</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Probe positioning carrier</title><source>esp@cenet</source><creator>Lai, Yi-Hsin ; Lin, Jia-Chuan ; Lee, Ching-Hsien ; Huang, Yu-Chen ; Jiang, Tai-Lin ; Tung, Wei-Shao</creator><creatorcontrib>Lai, Yi-Hsin ; Lin, Jia-Chuan ; Lee, Ching-Hsien ; Huang, Yu-Chen ; Jiang, Tai-Lin ; Tung, Wei-Shao</creatorcontrib><description>The present invention provides a probe positioning carrier, which includes an insulating seat and a magnetic unit that is embedded in the insulating seat. The insulating seat has a first end surface and a limiting slot that is recessed in the first end surface. The magnetic unit has a first magnetic end and a second magnetic end that is arranged opposite to the first magnetic, and the second magnetic end has a magnetism opposite to that of the first magnetic end. The first magnetic end is arranged adjacent to the limiting slot, and a distance between the first magnetic end and a bottom of the limiting slot is less than or equal to 3mm. The insulating seat allows a pin to insert into the limiting slot in a point contact manner, and the first magnetic end can be magnetically attracted with the pin, thereby maintaining the pin to be erected with respect to the first magnetic end.</description><language>chi ; eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220611&DB=EPODOC&CC=TW&NR=I767876B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25544,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220611&DB=EPODOC&CC=TW&NR=I767876B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Lai, Yi-Hsin</creatorcontrib><creatorcontrib>Lin, Jia-Chuan</creatorcontrib><creatorcontrib>Lee, Ching-Hsien</creatorcontrib><creatorcontrib>Huang, Yu-Chen</creatorcontrib><creatorcontrib>Jiang, Tai-Lin</creatorcontrib><creatorcontrib>Tung, Wei-Shao</creatorcontrib><title>Probe positioning carrier</title><description>The present invention provides a probe positioning carrier, which includes an insulating seat and a magnetic unit that is embedded in the insulating seat. The insulating seat has a first end surface and a limiting slot that is recessed in the first end surface. The magnetic unit has a first magnetic end and a second magnetic end that is arranged opposite to the first magnetic, and the second magnetic end has a magnetism opposite to that of the first magnetic end. The first magnetic end is arranged adjacent to the limiting slot, and a distance between the first magnetic end and a bottom of the limiting slot is less than or equal to 3mm. The insulating seat allows a pin to insert into the limiting slot in a point contact manner, and the first magnetic end can be magnetically attracted with the pin, thereby maintaining the pin to be erected with respect to the first magnetic end.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAMKMpPSlUoyC_OLMnMz8vMS1dITiwqykwt4mFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8SHhnuZm5hbmZk5OxkQoAQD_yyMP</recordid><startdate>20220611</startdate><enddate>20220611</enddate><creator>Lai, Yi-Hsin</creator><creator>Lin, Jia-Chuan</creator><creator>Lee, Ching-Hsien</creator><creator>Huang, Yu-Chen</creator><creator>Jiang, Tai-Lin</creator><creator>Tung, Wei-Shao</creator><scope>EVB</scope></search><sort><creationdate>20220611</creationdate><title>Probe positioning carrier</title><author>Lai, Yi-Hsin ; Lin, Jia-Chuan ; Lee, Ching-Hsien ; Huang, Yu-Chen ; Jiang, Tai-Lin ; Tung, Wei-Shao</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TWI767876BB3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Lai, Yi-Hsin</creatorcontrib><creatorcontrib>Lin, Jia-Chuan</creatorcontrib><creatorcontrib>Lee, Ching-Hsien</creatorcontrib><creatorcontrib>Huang, Yu-Chen</creatorcontrib><creatorcontrib>Jiang, Tai-Lin</creatorcontrib><creatorcontrib>Tung, Wei-Shao</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lai, Yi-Hsin</au><au>Lin, Jia-Chuan</au><au>Lee, Ching-Hsien</au><au>Huang, Yu-Chen</au><au>Jiang, Tai-Lin</au><au>Tung, Wei-Shao</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Probe positioning carrier</title><date>2022-06-11</date><risdate>2022</risdate><abstract>The present invention provides a probe positioning carrier, which includes an insulating seat and a magnetic unit that is embedded in the insulating seat. The insulating seat has a first end surface and a limiting slot that is recessed in the first end surface. The magnetic unit has a first magnetic end and a second magnetic end that is arranged opposite to the first magnetic, and the second magnetic end has a magnetism opposite to that of the first magnetic end. The first magnetic end is arranged adjacent to the limiting slot, and a distance between the first magnetic end and a bottom of the limiting slot is less than or equal to 3mm. The insulating seat allows a pin to insert into the limiting slot in a point contact manner, and the first magnetic end can be magnetically attracted with the pin, thereby maintaining the pin to be erected with respect to the first magnetic end.</abstract><oa>free_for_read</oa></addata></record> |
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language | chi ; eng |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | Probe positioning carrier |
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