ARTIFICIAL INTELLIGENCE DEFECT IMAGE CLASSIFICATION METHOD AND SYSTEM THEREOF
An artificial intelligence defect image classification method and a system are provide. The method includes: transferring a MEMS microphone product to a specific location by a transfer unit; positioning the MEMS microphone product by a positioning unit; scanning the MEMS microphone product to captur...
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| creator | LUO, ANUN LU, CHING-LUNG SHEN, CHIH-MING LIANG, MING-KAAN DAI, MING-JI SHEN, CHING-SHIANG YANG, HUNG-YU DENG, YU-SHAN CHUANG, YAIN |
| description | An artificial intelligence defect image classification method and a system are provide. The method includes: transferring a MEMS microphone product to a specific location by a transfer unit; positioning the MEMS microphone product by a positioning unit; scanning the MEMS microphone product to capture a test image by a first image capturing device; comparing the test image to a plurality of reference images, and determining a defect classification of the test image based on a comparison result; marking a defect area on the test image based on the comparison result; and classifying and storing the MEMS microphone product based on the defect classification. |
| format | Patent |
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| language | chi ; eng |
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| subjects | CALCULATING COMPUTING COUNTING DEAF-AID SETS ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKEACOUSTIC ELECTROMECHANICAL TRANSDUCERS MEASURING PHYSICS PUBLIC ADDRESS SYSTEMS TESTING |
| title | ARTIFICIAL INTELLIGENCE DEFECT IMAGE CLASSIFICATION METHOD AND SYSTEM THEREOF |
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