Systems and methods for workpiece processing

Systems and methods for processing workpieces, such as semiconductor workpieces are provided. One example embodiment is directed to a processing system for processing a plurality of workpieces. The plasma processing system can include a loadlock chamber. The loadlock chamber can include a workpiece...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: PAKULSKI, RYAN, YANG, MICHAEL
Format: Patent
Sprache:chi ; eng
Schlagworte:
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