Method and apparatus for dry gas phase chemically etching a structure

According to the invention there is provided a method of dry gas phase chemically etching a structure comprising the steps of: positioning the structure in an etch chamber, the structure comprising a first material and a second material, wherein the first material is selected from silicon, molybdenu...

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Bibliographische Detailangaben
Hauptverfasser: NEUMANN, JOHN, LEBOUITZ, KYLE S
Format: Patent
Sprache:chi ; eng
Schlagworte:
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