Ic chip appearance inspection module

An IC chip appearance inspection module including: a platform, two optical IC test seat, an image module and a drive device. The platform has a conveying unit and the two optical IC test seat are correspondingly set on the platform. The image module is set on the machine. The drive device is connect...

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Bibliographische Detailangaben
Hauptverfasser:	LIANG, CHI PING, CHANG, HSUNG LIANG, WANG, PO YEN, CHEN, CHIA-WEI, LEE, PO-HSUN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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