Methods of forming a gate-to-source/drain contact structure

One illustrative method disclosed herein includes, among other things, performing at least one etching process to expose at least a portion of an upper surface of a gate electrode of a first transistor device and at least a vertical portion of one side surface of the gate electrode and performing a...

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Bibliographische Detailangaben
Hauptverfasser: MERBETH, THOMAS, HOLT, JUDSON R, MULFINGER, GEORGE, XIE, RUILONG, MCARDLE, TIMOTHY J
Format: Patent
Sprache:chi ; eng
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