TWI699525B
Gespeichert in:
Hauptverfasser: | , , , , , , , , , , , , , , |
---|---|
Format: | Patent |
Sprache: | chi |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | LEE, KUN-YI LEE, WEI YU LAI, YI-XIAN YANG, WEING YU, YA-WEN ZHANG, YOU-JIA XU, KAI-JUN LIU, YA-LING LU, ZHI-XIAN SU, ZHI-MING LIN, KUNNG XIA, JIA-JUN LI, ZONG-YAN LIU, ZHAO-XIANG MIAO, YEN HAO |
description | |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TWI699525BB</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TWI699525BB</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TWI699525BB3</originalsourceid><addsrcrecordid>eNrjZOAKCfc0s7Q0NTJ14mFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8QgNTsZEKAEAD6QbnQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>TWI699525B</title><source>esp@cenet</source><creator>LEE, KUN-YI ; LEE, WEI YU ; LAI, YI-XIAN ; YANG, WEING ; YU, YA-WEN ; ZHANG, YOU-JIA ; XU, KAI-JUN ; LIU, YA-LING ; LU, ZHI-XIAN ; SU, ZHI-MING ; LIN, KUNNG ; XIA, JIA-JUN ; LI, ZONG-YAN ; LIU, ZHAO-XIANG ; MIAO, YEN HAO</creator><creatorcontrib>LEE, KUN-YI ; LEE, WEI YU ; LAI, YI-XIAN ; YANG, WEING ; YU, YA-WEN ; ZHANG, YOU-JIA ; XU, KAI-JUN ; LIU, YA-LING ; LU, ZHI-XIAN ; SU, ZHI-MING ; LIN, KUNNG ; XIA, JIA-JUN ; LI, ZONG-YAN ; LIU, ZHAO-XIANG ; MIAO, YEN HAO</creatorcontrib><language>chi</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200721&DB=EPODOC&CC=TW&NR=I699525B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200721&DB=EPODOC&CC=TW&NR=I699525B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LEE, KUN-YI</creatorcontrib><creatorcontrib>LEE, WEI YU</creatorcontrib><creatorcontrib>LAI, YI-XIAN</creatorcontrib><creatorcontrib>YANG, WEING</creatorcontrib><creatorcontrib>YU, YA-WEN</creatorcontrib><creatorcontrib>ZHANG, YOU-JIA</creatorcontrib><creatorcontrib>XU, KAI-JUN</creatorcontrib><creatorcontrib>LIU, YA-LING</creatorcontrib><creatorcontrib>LU, ZHI-XIAN</creatorcontrib><creatorcontrib>SU, ZHI-MING</creatorcontrib><creatorcontrib>LIN, KUNNG</creatorcontrib><creatorcontrib>XIA, JIA-JUN</creatorcontrib><creatorcontrib>LI, ZONG-YAN</creatorcontrib><creatorcontrib>LIU, ZHAO-XIANG</creatorcontrib><creatorcontrib>MIAO, YEN HAO</creatorcontrib><title>TWI699525B</title><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZOAKCfc0s7Q0NTJ14mFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8QgNTsZEKAEAD6QbnQ</recordid><startdate>20200721</startdate><enddate>20200721</enddate><creator>LEE, KUN-YI</creator><creator>LEE, WEI YU</creator><creator>LAI, YI-XIAN</creator><creator>YANG, WEING</creator><creator>YU, YA-WEN</creator><creator>ZHANG, YOU-JIA</creator><creator>XU, KAI-JUN</creator><creator>LIU, YA-LING</creator><creator>LU, ZHI-XIAN</creator><creator>SU, ZHI-MING</creator><creator>LIN, KUNNG</creator><creator>XIA, JIA-JUN</creator><creator>LI, ZONG-YAN</creator><creator>LIU, ZHAO-XIANG</creator><creator>MIAO, YEN HAO</creator><scope>EVB</scope></search><sort><creationdate>20200721</creationdate><title>TWI699525B</title><author>LEE, KUN-YI ; LEE, WEI YU ; LAI, YI-XIAN ; YANG, WEING ; YU, YA-WEN ; ZHANG, YOU-JIA ; XU, KAI-JUN ; LIU, YA-LING ; LU, ZHI-XIAN ; SU, ZHI-MING ; LIN, KUNNG ; XIA, JIA-JUN ; LI, ZONG-YAN ; LIU, ZHAO-XIANG ; MIAO, YEN HAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TWI699525BB3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi</language><creationdate>2020</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LEE, KUN-YI</creatorcontrib><creatorcontrib>LEE, WEI YU</creatorcontrib><creatorcontrib>LAI, YI-XIAN</creatorcontrib><creatorcontrib>YANG, WEING</creatorcontrib><creatorcontrib>YU, YA-WEN</creatorcontrib><creatorcontrib>ZHANG, YOU-JIA</creatorcontrib><creatorcontrib>XU, KAI-JUN</creatorcontrib><creatorcontrib>LIU, YA-LING</creatorcontrib><creatorcontrib>LU, ZHI-XIAN</creatorcontrib><creatorcontrib>SU, ZHI-MING</creatorcontrib><creatorcontrib>LIN, KUNNG</creatorcontrib><creatorcontrib>XIA, JIA-JUN</creatorcontrib><creatorcontrib>LI, ZONG-YAN</creatorcontrib><creatorcontrib>LIU, ZHAO-XIANG</creatorcontrib><creatorcontrib>MIAO, YEN HAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LEE, KUN-YI</au><au>LEE, WEI YU</au><au>LAI, YI-XIAN</au><au>YANG, WEING</au><au>YU, YA-WEN</au><au>ZHANG, YOU-JIA</au><au>XU, KAI-JUN</au><au>LIU, YA-LING</au><au>LU, ZHI-XIAN</au><au>SU, ZHI-MING</au><au>LIN, KUNNG</au><au>XIA, JIA-JUN</au><au>LI, ZONG-YAN</au><au>LIU, ZHAO-XIANG</au><au>MIAO, YEN HAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TWI699525B</title><date>2020-07-21</date><risdate>2020</risdate><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi |
recordid | cdi_epo_espacenet_TWI699525BB |
source | esp@cenet |
subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
title | TWI699525B |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T11%3A56%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LEE,%20KUN-YI&rft.date=2020-07-21&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ETWI699525BB%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |