TWI699525B

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Hauptverfasser: LEE, KUN-YI, LEE, WEI YU, LAI, YI-XIAN, YANG, WEING, YU, YA-WEN, ZHANG, YOU-JIA, XU, KAI-JUN, LIU, YA-LING, LU, ZHI-XIAN, SU, ZHI-MING, LIN, KUNNG, XIA, JIA-JUN, LI, ZONG-YAN, LIU, ZHAO-XIANG, MIAO, YEN HAO
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Sprache:chi
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creator LEE, KUN-YI
LEE, WEI YU
LAI, YI-XIAN
YANG, WEING
YU, YA-WEN
ZHANG, YOU-JIA
XU, KAI-JUN
LIU, YA-LING
LU, ZHI-XIAN
SU, ZHI-MING
LIN, KUNNG
XIA, JIA-JUN
LI, ZONG-YAN
LIU, ZHAO-XIANG
MIAO, YEN HAO
description
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TWI699525BB</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TWI699525BB</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TWI699525BB3</originalsourceid><addsrcrecordid>eNrjZOAKCfc0s7Q0NTJ14mFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8QgNTsZEKAEAD6QbnQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>TWI699525B</title><source>esp@cenet</source><creator>LEE, KUN-YI ; LEE, WEI YU ; LAI, YI-XIAN ; YANG, WEING ; YU, YA-WEN ; ZHANG, YOU-JIA ; XU, KAI-JUN ; LIU, YA-LING ; LU, ZHI-XIAN ; SU, ZHI-MING ; LIN, KUNNG ; XIA, JIA-JUN ; LI, ZONG-YAN ; LIU, ZHAO-XIANG ; MIAO, YEN HAO</creator><creatorcontrib>LEE, KUN-YI ; LEE, WEI YU ; LAI, YI-XIAN ; YANG, WEING ; YU, YA-WEN ; ZHANG, YOU-JIA ; XU, KAI-JUN ; LIU, YA-LING ; LU, ZHI-XIAN ; SU, ZHI-MING ; LIN, KUNNG ; XIA, JIA-JUN ; LI, ZONG-YAN ; LIU, ZHAO-XIANG ; MIAO, YEN HAO</creatorcontrib><language>chi</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200721&amp;DB=EPODOC&amp;CC=TW&amp;NR=I699525B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20200721&amp;DB=EPODOC&amp;CC=TW&amp;NR=I699525B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LEE, KUN-YI</creatorcontrib><creatorcontrib>LEE, WEI YU</creatorcontrib><creatorcontrib>LAI, YI-XIAN</creatorcontrib><creatorcontrib>YANG, WEING</creatorcontrib><creatorcontrib>YU, YA-WEN</creatorcontrib><creatorcontrib>ZHANG, YOU-JIA</creatorcontrib><creatorcontrib>XU, KAI-JUN</creatorcontrib><creatorcontrib>LIU, YA-LING</creatorcontrib><creatorcontrib>LU, ZHI-XIAN</creatorcontrib><creatorcontrib>SU, ZHI-MING</creatorcontrib><creatorcontrib>LIN, KUNNG</creatorcontrib><creatorcontrib>XIA, JIA-JUN</creatorcontrib><creatorcontrib>LI, ZONG-YAN</creatorcontrib><creatorcontrib>LIU, ZHAO-XIANG</creatorcontrib><creatorcontrib>MIAO, YEN HAO</creatorcontrib><title>TWI699525B</title><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZOAKCfc0s7Q0NTJ14mFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8QgNTsZEKAEAD6QbnQ</recordid><startdate>20200721</startdate><enddate>20200721</enddate><creator>LEE, KUN-YI</creator><creator>LEE, WEI YU</creator><creator>LAI, YI-XIAN</creator><creator>YANG, WEING</creator><creator>YU, YA-WEN</creator><creator>ZHANG, YOU-JIA</creator><creator>XU, KAI-JUN</creator><creator>LIU, YA-LING</creator><creator>LU, ZHI-XIAN</creator><creator>SU, ZHI-MING</creator><creator>LIN, KUNNG</creator><creator>XIA, JIA-JUN</creator><creator>LI, ZONG-YAN</creator><creator>LIU, ZHAO-XIANG</creator><creator>MIAO, YEN HAO</creator><scope>EVB</scope></search><sort><creationdate>20200721</creationdate><title>TWI699525B</title><author>LEE, KUN-YI ; LEE, WEI YU ; LAI, YI-XIAN ; YANG, WEING ; YU, YA-WEN ; ZHANG, YOU-JIA ; XU, KAI-JUN ; LIU, YA-LING ; LU, ZHI-XIAN ; SU, ZHI-MING ; LIN, KUNNG ; XIA, JIA-JUN ; LI, ZONG-YAN ; LIU, ZHAO-XIANG ; MIAO, YEN HAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TWI699525BB3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi</language><creationdate>2020</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LEE, KUN-YI</creatorcontrib><creatorcontrib>LEE, WEI YU</creatorcontrib><creatorcontrib>LAI, YI-XIAN</creatorcontrib><creatorcontrib>YANG, WEING</creatorcontrib><creatorcontrib>YU, YA-WEN</creatorcontrib><creatorcontrib>ZHANG, YOU-JIA</creatorcontrib><creatorcontrib>XU, KAI-JUN</creatorcontrib><creatorcontrib>LIU, YA-LING</creatorcontrib><creatorcontrib>LU, ZHI-XIAN</creatorcontrib><creatorcontrib>SU, ZHI-MING</creatorcontrib><creatorcontrib>LIN, KUNNG</creatorcontrib><creatorcontrib>XIA, JIA-JUN</creatorcontrib><creatorcontrib>LI, ZONG-YAN</creatorcontrib><creatorcontrib>LIU, ZHAO-XIANG</creatorcontrib><creatorcontrib>MIAO, YEN HAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LEE, KUN-YI</au><au>LEE, WEI YU</au><au>LAI, YI-XIAN</au><au>YANG, WEING</au><au>YU, YA-WEN</au><au>ZHANG, YOU-JIA</au><au>XU, KAI-JUN</au><au>LIU, YA-LING</au><au>LU, ZHI-XIAN</au><au>SU, ZHI-MING</au><au>LIN, KUNNG</au><au>XIA, JIA-JUN</au><au>LI, ZONG-YAN</au><au>LIU, ZHAO-XIANG</au><au>MIAO, YEN HAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TWI699525B</title><date>2020-07-21</date><risdate>2020</risdate><oa>free_for_read</oa></addata></record>
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recordid cdi_epo_espacenet_TWI699525BB
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title TWI699525B
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T11%3A56%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LEE,%20KUN-YI&rft.date=2020-07-21&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ETWI699525BB%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true