Scanning unit for scanning a scale and position- measuring device
A scanning unit adapted for scanning a measuring graduation of a scale for purposes of position measurement in a measurement direction includes a housing having a detector configured to generate position-dependent scanning signals. An electrical lead passes out through the housing in the measurement...
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creator | KUEHNHAUSER, STEFAN PUCHER, WOLFGANG RIESEMANN, BERNHARD |
description | A scanning unit adapted for scanning a measuring graduation of a scale for purposes of position measurement in a measurement direction includes a housing having a detector configured to generate position-dependent scanning signals. An electrical lead passes out through the housing in the measurement direction. A rotatable member, in which the electrical lead is routed, has a first section extending in the measurement direction and a second section extending in a second direction at an angle relative to the measurement direction. The rotatable member is rotatably mounted on the housing about an axis of rotation extending in the measurement direction. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TWI638978BB</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TWI638978BB</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TWI638978BB3</originalsourceid><addsrcrecordid>eNrjZHAMTk7My8vMS1cozcssUUjLL1Iohokkgpg5qQqJeSkKBfnFmSWZ-Xm6CrmpicWlRSD5lNSyzORUHgbWtMSc4lReKM3NoODmGuLsoZtakB-fWlyQmJyal1oSHxLuaWZsYWlu4eRkTIQSAIW8MYY</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Scanning unit for scanning a scale and position- measuring device</title><source>esp@cenet</source><creator>KUEHNHAUSER, STEFAN ; PUCHER, WOLFGANG ; RIESEMANN, BERNHARD</creator><creatorcontrib>KUEHNHAUSER, STEFAN ; PUCHER, WOLFGANG ; RIESEMANN, BERNHARD</creatorcontrib><description>A scanning unit adapted for scanning a measuring graduation of a scale for purposes of position measurement in a measurement direction includes a housing having a detector configured to generate position-dependent scanning signals. An electrical lead passes out through the housing in the measurement direction. A rotatable member, in which the electrical lead is routed, has a first section extending in the measurement direction and a second section extending in a second direction at an angle relative to the measurement direction. The rotatable member is rotatably mounted on the housing about an axis of rotation extending in the measurement direction.</description><language>chi ; eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; BASIC ELECTRIC ELEMENTS ; CURRENT COLLECTORS ; ELECTRICITY ; LINE CONNECTORS ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181021&DB=EPODOC&CC=TW&NR=I638978B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181021&DB=EPODOC&CC=TW&NR=I638978B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KUEHNHAUSER, STEFAN</creatorcontrib><creatorcontrib>PUCHER, WOLFGANG</creatorcontrib><creatorcontrib>RIESEMANN, BERNHARD</creatorcontrib><title>Scanning unit for scanning a scale and position- measuring device</title><description>A scanning unit adapted for scanning a measuring graduation of a scale for purposes of position measurement in a measurement direction includes a housing having a detector configured to generate position-dependent scanning signals. An electrical lead passes out through the housing in the measurement direction. A rotatable member, in which the electrical lead is routed, has a first section extending in the measurement direction and a second section extending in a second direction at an angle relative to the measurement direction. The rotatable member is rotatably mounted on the housing about an axis of rotation extending in the measurement direction.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CURRENT COLLECTORS</subject><subject>ELECTRICITY</subject><subject>LINE CONNECTORS</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAMTk7My8vMS1cozcssUUjLL1Iohokkgpg5qQqJeSkKBfnFmSWZ-Xm6CrmpicWlRSD5lNSyzORUHgbWtMSc4lReKM3NoODmGuLsoZtakB-fWlyQmJyal1oSHxLuaWZsYWlu4eRkTIQSAIW8MYY</recordid><startdate>20181021</startdate><enddate>20181021</enddate><creator>KUEHNHAUSER, STEFAN</creator><creator>PUCHER, WOLFGANG</creator><creator>RIESEMANN, BERNHARD</creator><scope>EVB</scope></search><sort><creationdate>20181021</creationdate><title>Scanning unit for scanning a scale and position- measuring device</title><author>KUEHNHAUSER, STEFAN ; PUCHER, WOLFGANG ; RIESEMANN, BERNHARD</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TWI638978BB3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2018</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CURRENT COLLECTORS</topic><topic>ELECTRICITY</topic><topic>LINE CONNECTORS</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KUEHNHAUSER, STEFAN</creatorcontrib><creatorcontrib>PUCHER, WOLFGANG</creatorcontrib><creatorcontrib>RIESEMANN, BERNHARD</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KUEHNHAUSER, STEFAN</au><au>PUCHER, WOLFGANG</au><au>RIESEMANN, BERNHARD</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Scanning unit for scanning a scale and position- measuring device</title><date>2018-10-21</date><risdate>2018</risdate><abstract>A scanning unit adapted for scanning a measuring graduation of a scale for purposes of position measurement in a measurement direction includes a housing having a detector configured to generate position-dependent scanning signals. An electrical lead passes out through the housing in the measurement direction. A rotatable member, in which the electrical lead is routed, has a first section extending in the measurement direction and a second section extending in a second direction at an angle relative to the measurement direction. The rotatable member is rotatably mounted on the housing about an axis of rotation extending in the measurement direction.</abstract><oa>free_for_read</oa></addata></record> |
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language | chi ; eng |
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subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS BASIC ELECTRIC ELEMENTS CURRENT COLLECTORS ELECTRICITY LINE CONNECTORS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
title | Scanning unit for scanning a scale and position- measuring device |
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