Edge exclusion control with adjustable plasma exclusion zone ring

Systems and methods for edge exclusion control are described. One of the systems includes a plasma chamber. The plasma processing chamber includes a lower electrode having a surface for supporting a substrate. The lower electrode is coupled with a radio frequency (RF) power supply. The plasma proces...

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Bibliographische Detailangaben
Hauptverfasser: KIM, KEECHAN, KIM, YANSUNG
Format: Patent
Sprache:chi ; eng
Schlagworte:
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