Displacement device
Positioning device having a first part (1) which is movable relative to a second part (2) in a X and Y-direction, said first part (1) comprising a carrier (5) on which a system of magnets (3) is arranged in a pattern of rows (7) and columns (8) parallel to the X- and Y-direction, respectively. The m...
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| creator | RENKENS, MICHAEL JOSEPHA MATHIJS COMPTER, JOHAN CORNELIS FOCKERT, GEORGE ARIE JAN DE FRISSEN, PETRUS CAROLUS MARIA COOLEN, ROB JACOBUS MATHEUS |
| description | Positioning device having a first part (1) which is movable relative to a second part (2) in a X and Y-direction, said first part (1) comprising a carrier (5) on which a system of magnets (3) is arranged in a pattern of rows (7) and columns (8) parallel to the X- and Y-direction, respectively. The magnets in each row and column are arranged in a Halbach array, i.e. the magnetic orientation of each successive magnet in each row (7) and each column (8) is rotated through 90 DEG counter-clockwise. The second part (2) comprises an electric coil system (4) with two types of electric coils (C1, C2), one type having an angular offset of +45 DEG and the other type having an offset of -45 DEG with respect to the X-direction. The magnet configuration causes a very strong magnetic Held. The positioning device comprises a number of magnetically sensitive sensors (Hall sensors 45) giving a signal which depends on the local mutual positions of the permanent magnets of the first part relative to the electric coils of the second part in an area in which the parts overlap. |
| format | Patent |
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The magnets in each row and column are arranged in a Halbach array, i.e. the magnetic orientation of each successive magnet in each row (7) and each column (8) is rotated through 90 DEG counter-clockwise. The second part (2) comprises an electric coil system (4) with two types of electric coils (C1, C2), one type having an angular offset of +45 DEG and the other type having an offset of -45 DEG with respect to the X-direction. The magnet configuration causes a very strong magnetic Held. The positioning device comprises a number of magnetically sensitive sensors (Hall sensors 45) giving a signal which depends on the local mutual positions of the permanent magnets of the first part relative to the electric coils of the second part in an area in which the parts overlap.</description><edition>7</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; CONSTRUCTIONAL DETAILS OF INSTRUMENTS, OR COMPARABLE DETAILSOF OTHER APPARATUS, NOT OTHERWISE PROVIDED FOR ; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ; DYNAMO-ELECTRIC MACHINES ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; GENERATION ; INSTRUMENT DETAILS ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060721&DB=EPODOC&CC=TW&NR=I258914B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060721&DB=EPODOC&CC=TW&NR=I258914B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>RENKENS, MICHAEL JOSEPHA MATHIJS</creatorcontrib><creatorcontrib>COMPTER, JOHAN CORNELIS</creatorcontrib><creatorcontrib>FOCKERT, GEORGE ARIE JAN DE</creatorcontrib><creatorcontrib>FRISSEN, PETRUS CAROLUS MARIA</creatorcontrib><creatorcontrib>COOLEN, ROB JACOBUS MATHEUS</creatorcontrib><title>Displacement device</title><description>Positioning device having a first part (1) which is movable relative to a second part (2) in a X and Y-direction, said first part (1) comprising a carrier (5) on which a system of magnets (3) is arranged in a pattern of rows (7) and columns (8) parallel to the X- and Y-direction, respectively. The magnets in each row and column are arranged in a Halbach array, i.e. the magnetic orientation of each successive magnet in each row (7) and each column (8) is rotated through 90 DEG counter-clockwise. The second part (2) comprises an electric coil system (4) with two types of electric coils (C1, C2), one type having an angular offset of +45 DEG and the other type having an offset of -45 DEG with respect to the X-direction. The magnet configuration causes a very strong magnetic Held. The positioning device comprises a number of magnetically sensitive sensors (Hall sensors 45) giving a signal which depends on the local mutual positions of the permanent magnets of the first part relative to the electric coils of the second part in an area in which the parts overlap.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CONSTRUCTIONAL DETAILS OF INSTRUMENTS, OR COMPARABLE DETAILSOF OTHER APPARATUS, NOT OTHERWISE PROVIDED FOR</subject><subject>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</subject><subject>DYNAMO-ELECTRIC MACHINES</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>GENERATION</subject><subject>INSTRUMENT DETAILS</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBB2ySwuyElMTs1NzStRSEkty0xO5WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFQNV5qSXxIeGeRqYWloYmTk7GRCgBAPZgIIc</recordid><startdate>20060721</startdate><enddate>20060721</enddate><creator>RENKENS, MICHAEL JOSEPHA MATHIJS</creator><creator>COMPTER, JOHAN CORNELIS</creator><creator>FOCKERT, GEORGE ARIE JAN DE</creator><creator>FRISSEN, PETRUS CAROLUS MARIA</creator><creator>COOLEN, ROB JACOBUS MATHEUS</creator><scope>EVB</scope></search><sort><creationdate>20060721</creationdate><title>Displacement device</title><author>RENKENS, MICHAEL JOSEPHA MATHIJS ; COMPTER, JOHAN CORNELIS ; FOCKERT, GEORGE ARIE JAN DE ; FRISSEN, PETRUS CAROLUS MARIA ; COOLEN, ROB JACOBUS MATHEUS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TWI258914BB3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CONSTRUCTIONAL DETAILS OF INSTRUMENTS, OR COMPARABLE DETAILSOF OTHER APPARATUS, NOT OTHERWISE PROVIDED FOR</topic><topic>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</topic><topic>DYNAMO-ELECTRIC MACHINES</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>GENERATION</topic><topic>INSTRUMENT DETAILS</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>RENKENS, MICHAEL JOSEPHA MATHIJS</creatorcontrib><creatorcontrib>COMPTER, JOHAN CORNELIS</creatorcontrib><creatorcontrib>FOCKERT, GEORGE ARIE JAN DE</creatorcontrib><creatorcontrib>FRISSEN, PETRUS CAROLUS MARIA</creatorcontrib><creatorcontrib>COOLEN, ROB JACOBUS MATHEUS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>RENKENS, MICHAEL JOSEPHA MATHIJS</au><au>COMPTER, JOHAN CORNELIS</au><au>FOCKERT, GEORGE ARIE JAN DE</au><au>FRISSEN, PETRUS CAROLUS MARIA</au><au>COOLEN, ROB JACOBUS MATHEUS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Displacement device</title><date>2006-07-21</date><risdate>2006</risdate><abstract>Positioning device having a first part (1) which is movable relative to a second part (2) in a X and Y-direction, said first part (1) comprising a carrier (5) on which a system of magnets (3) is arranged in a pattern of rows (7) and columns (8) parallel to the X- and Y-direction, respectively. The magnets in each row and column are arranged in a Halbach array, i.e. the magnetic orientation of each successive magnet in each row (7) and each column (8) is rotated through 90 DEG counter-clockwise. The second part (2) comprises an electric coil system (4) with two types of electric coils (C1, C2), one type having an angular offset of +45 DEG and the other type having an offset of -45 DEG with respect to the X-direction. The magnet configuration causes a very strong magnetic Held. The positioning device comprises a number of magnetically sensitive sensors (Hall sensors 45) giving a signal which depends on the local mutual positions of the permanent magnets of the first part relative to the electric coils of the second part in an area in which the parts overlap.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS CONSTRUCTIONAL DETAILS OF INSTRUMENTS, OR COMPARABLE DETAILSOF OTHER APPARATUS, NOT OTHERWISE PROVIDED FOR CONVERSION OR DISTRIBUTION OF ELECTRIC POWER DYNAMO-ELECTRIC MACHINES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY GENERATION INSTRUMENT DETAILS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | Displacement device |
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