Electrical performance enhanced wafer level chip scale package with ground

A method including providing a first substrate having a first bond pad and a second bond pad; forming a subassembly comprising securing a second substrate to the first substrate with a ground layer interposed between the first substrate and the second substrate; forming a first trench in the subasse...

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Bibliographische Detailangaben
Hauptverfasser: HUANG, CHENDER, WANG, JONES, CHEN, CHIHIANG, TSAO, PEI-HAW, HUANG, HANK
Format: Patent
Sprache:eng
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