Method for detecting defectives in an integrated circuit

A method for detecting defectives in an integrated circuit that is composed of a plurality of transistors in parallel. The method includes the following steps: applying a bias to the plurality of transistors in parallel; and catching the infrared imagery of the plurality of transistors.

Bibliographische Detailangaben

Hauptverfasser:	HU, CHENGI, HUANG, CHUNG-ER, WU, JANNE-WHA, SHIIH, YINGOU
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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