System initialization of macrocode-based memory built-in self-test

The functionality of a programmable memory built-in self-test (BIST) arrangement for testing an embedded memory structure of an integrated circuit is extended to system level testing to ascertain operability of the system after the integrated circuits and boards including them have been placed in se...

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Bibliographische Detailangaben

Hauptverfasser:	ZARRINEH, KAMRAN, GREGOR, STEVEN L, ECKENRODE, THOMAS J, ADAMS, R. DEAN
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
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