Metal pad of semiconductor device
Metal pads of semiconductor device are located in the opening of the passivation layer and are connected to the metal connection layer of the semiconductor devices through plural metal plugs. They consist of a first aluminum alloy layer, a laser stop layer and a second aluminum alloy layer. The said...
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creator | CHIAN, JIAI |
description | Metal pads of semiconductor device are located in the opening of the passivation layer and are connected to the metal connection layer of the semiconductor devices through plural metal plugs. They consist of a first aluminum alloy layer, a laser stop layer and a second aluminum alloy layer. The said first aluminum alloy layer is located upon the metal plugs; the said laser stop layer is located on the first aluminum alloy layer and is composed of metal having high melting point and high laser reflectance. The thickness of the laser stop layer is between 500 to 5000 angstroms. The said second aluminum alloy layer is located upon the laser stop layer and its thickness is between 1000 to 20000 angstroms. |
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They consist of a first aluminum alloy layer, a laser stop layer and a second aluminum alloy layer. The said first aluminum alloy layer is located upon the metal plugs; the said laser stop layer is located on the first aluminum alloy layer and is composed of metal having high melting point and high laser reflectance. The thickness of the laser stop layer is between 500 to 5000 angstroms. 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They consist of a first aluminum alloy layer, a laser stop layer and a second aluminum alloy layer. The said first aluminum alloy layer is located upon the metal plugs; the said laser stop layer is located on the first aluminum alloy layer and is composed of metal having high melting point and high laser reflectance. The thickness of the laser stop layer is between 500 to 5000 angstroms. The said second aluminum alloy layer is located upon the laser stop layer and its thickness is between 1000 to 20000 angstroms.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD0TS1JzFEoSExRyE9TKE7NzUzOz0spTS7JL1JISS3LTE7lYWBNS8wpTuWF0twM8m6uIc4euqkF-fGpxQWJyal5qSXxIeGmxoYWhsZOTsaEVQAA46gk9A</recordid><startdate>20030511</startdate><enddate>20030511</enddate><creator>CHIAN, JIAI</creator><scope>EVB</scope></search><sort><creationdate>20030511</creationdate><title>Metal pad of semiconductor device</title><author>CHIAN, JIAI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TW531813BB3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>CHIAN, JIAI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHIAN, JIAI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Metal pad of semiconductor device</title><date>2003-05-11</date><risdate>2003</risdate><abstract>Metal pads of semiconductor device are located in the opening of the passivation layer and are connected to the metal connection layer of the semiconductor devices through plural metal plugs. They consist of a first aluminum alloy layer, a laser stop layer and a second aluminum alloy layer. The said first aluminum alloy layer is located upon the metal plugs; the said laser stop layer is located on the first aluminum alloy layer and is composed of metal having high melting point and high laser reflectance. The thickness of the laser stop layer is between 500 to 5000 angstroms. The said second aluminum alloy layer is located upon the laser stop layer and its thickness is between 1000 to 20000 angstroms.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | Metal pad of semiconductor device |
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