Internal supply voltage generating circuit

An internal supply voltage generating circuit for providing an increased internal supply voltage by the application of an external supply voltage during a burn-in test is provided. The internal supply voltage generating circuit includes a comparator for comparing the internal supply voltage with a predetermined reference voltage and generating a driving signal for increasing the internal supply voltage to the reference voltage when the internal supply voltage is lower than the reference voltage, a comparison controller for blocking off a current path of the comparator to a ground voltage to restrain operation of the comparator during the burn-in test, an input controller for blocking off the internal supply voltage which is applied to an input terminal of the comparator in response to a burn-in control signal activated during the burn-in test, a driver unit for supplying the external supply voltage to raise the internal supply voltage in response to the driving signal and driving the internal supply voltage with the external supply voltage in response to the burn-in control signal, and an auxiliary blocking unit for blocking off a current path of the external supply voltage to the comparator to restrain the operation of the comparator during the burn-in test.