Test handler
In accordance with an aspect of the present disclosure, there may be provided a test handler including: a cleaning device for removing foreign substances from a tester socket of a tester; a test tray including an insert for seating the cleaning device thereon; a loading device that loads the cleanin...
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| creator | NA, YUN-SUNG HWANG, JUNG-WOO |
| description | In accordance with an aspect of the present disclosure, there may be provided a test handler including: a cleaning device for removing foreign substances from a tester socket of a tester; a test tray including an insert for seating the cleaning device thereon; a loading device that loads the cleaning device into the test tray; a pushing device for bringing the cleaning device mounted on the test tray into contact with the tester socket by bringing the test tray into close contact with the tester socket of the tester; an unloading device that unloads the cleaning device from the test tray; and a cleaning device tray that accommodates the cleaning device loaded into the test tray by the loading device or accommodates the cleaning device unloaded from the unloading device. |
| format | Patent |
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a pushing device for bringing the cleaning device mounted on the test tray into contact with the tester socket by bringing the test tray into close contact with the tester socket of the tester; an unloading device that unloads the cleaning device from the test tray; and a cleaning device tray that accommodates the cleaning device loaded into the test tray by the loading device or accommodates the cleaning device unloaded from the unloading device.</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240501&DB=EPODOC&CC=TW&NR=202417870A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25544,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240501&DB=EPODOC&CC=TW&NR=202417870A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NA, YUN-SUNG</creatorcontrib><creatorcontrib>HWANG, JUNG-WOO</creatorcontrib><title>Test handler</title><description>In accordance with an aspect of the present disclosure, there may be provided a test handler including: a cleaning device for removing foreign substances from a tester socket of a tester; a test tray including an insert for seating the cleaning device thereon; a loading device that loads the cleaning device into the test tray; a pushing device for bringing the cleaning device mounted on the test tray into contact with the tester socket by bringing the test tray into close contact with the tester socket of the tester; an unloading device that unloads the cleaning device from the test tray; and a cleaning device tray that accommodates the cleaning device loaded into the test tray by the loading device or accommodates the cleaning device unloaded from the unloading device.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZOAJSS0uUchIzEvJSS3iYWBNS8wpTuWF0twMim6uIc4euqkF-fGpxQWJyal5qSXxIeFGBkYmhuYW5gaOxsSoAQAFXx3D</recordid><startdate>20240501</startdate><enddate>20240501</enddate><creator>NA, YUN-SUNG</creator><creator>HWANG, JUNG-WOO</creator><scope>EVB</scope></search><sort><creationdate>20240501</creationdate><title>Test handler</title><author>NA, YUN-SUNG ; HWANG, JUNG-WOO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TW202417870A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NA, YUN-SUNG</creatorcontrib><creatorcontrib>HWANG, JUNG-WOO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NA, YUN-SUNG</au><au>HWANG, JUNG-WOO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Test handler</title><date>2024-05-01</date><risdate>2024</risdate><abstract>In accordance with an aspect of the present disclosure, there may be provided a test handler including: a cleaning device for removing foreign substances from a tester socket of a tester; a test tray including an insert for seating the cleaning device thereon; a loading device that loads the cleaning device into the test tray; a pushing device for bringing the cleaning device mounted on the test tray into contact with the tester socket by bringing the test tray into close contact with the tester socket of the tester; an unloading device that unloads the cleaning device from the test tray; and a cleaning device tray that accommodates the cleaning device loaded into the test tray by the loading device or accommodates the cleaning device unloaded from the unloading device.</abstract><oa>free_for_read</oa></addata></record> |
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| language | chi ; eng |
| recordid | cdi_epo_espacenet_TW202417870A |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Test handler |
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