Portable disc to measure chemical gas contaminants within semiconductor equipment and clean room
A detector disc includes a disc body having a bottom disc and a top cover, the top cover including a first aperture. A sensor is disposed inside the disc body and positioned to be exposed to an external environment via the first aperture in the top cover. The solid state sensor is adapted to detect...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | HOLEYANNAVAR, DEVENDRA CHANNAPPA HUDGENS, JEFFREY C NARA, SHIVARAJ MANJUNATH RAMACHANDRAIAH, ARUNKUMAR REUTER, PAUL B HRUZEK, DEAN C |
description | A detector disc includes a disc body having a bottom disc and a top cover, the top cover including a first aperture. A sensor is disposed inside the disc body and positioned to be exposed to an external environment via the first aperture in the top cover. The solid state sensor is adapted to detect levels of chemical gas contaminants and output a detection signal based on detected levels of the chemical gas contaminants. A microcontroller is disposed on the PCB and adapted to generate measurement data from the detected levels of the chemical gas contaminants embodied within the detection signal. A wireless communication circuit is disposed on the PCB, the wireless communication circuit adapted to transmit the measurement data wirelessly to a wireless access point device. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TW202413945A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TW202413945A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TW202413945A3</originalsourceid><addsrcrecordid>eNqNyjEKwlAMgOEuDqLeIR5A0LYOjiKKo0PBscY02gfvJfUlxeuL4AGc_uH7p8XtotnxHhm6YASukBhtzAzUcwqEEZ5oQCqOKQiKG7yD90HAvq7SjeSagV9jGBKLA0oHFBkFsmqaF5MHRuPFr7NieTo2h_OKB23ZBiQW9ra5luuy3lS7eruv_nk-CW8-BQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Portable disc to measure chemical gas contaminants within semiconductor equipment and clean room</title><source>esp@cenet</source><creator>HOLEYANNAVAR, DEVENDRA CHANNAPPA ; HUDGENS, JEFFREY C ; NARA, SHIVARAJ MANJUNATH ; RAMACHANDRAIAH, ARUNKUMAR ; REUTER, PAUL B ; HRUZEK, DEAN C</creator><creatorcontrib>HOLEYANNAVAR, DEVENDRA CHANNAPPA ; HUDGENS, JEFFREY C ; NARA, SHIVARAJ MANJUNATH ; RAMACHANDRAIAH, ARUNKUMAR ; REUTER, PAUL B ; HRUZEK, DEAN C</creatorcontrib><description>A detector disc includes a disc body having a bottom disc and a top cover, the top cover including a first aperture. A sensor is disposed inside the disc body and positioned to be exposed to an external environment via the first aperture in the top cover. The solid state sensor is adapted to detect levels of chemical gas contaminants and output a detection signal based on detected levels of the chemical gas contaminants. A microcontroller is disposed on the PCB and adapted to generate measurement data from the detected levels of the chemical gas contaminants embodied within the detection signal. A wireless communication circuit is disposed on the PCB, the wireless communication circuit adapted to transmit the measurement data wirelessly to a wireless access point device.</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240401&DB=EPODOC&CC=TW&NR=202413945A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240401&DB=EPODOC&CC=TW&NR=202413945A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HOLEYANNAVAR, DEVENDRA CHANNAPPA</creatorcontrib><creatorcontrib>HUDGENS, JEFFREY C</creatorcontrib><creatorcontrib>NARA, SHIVARAJ MANJUNATH</creatorcontrib><creatorcontrib>RAMACHANDRAIAH, ARUNKUMAR</creatorcontrib><creatorcontrib>REUTER, PAUL B</creatorcontrib><creatorcontrib>HRUZEK, DEAN C</creatorcontrib><title>Portable disc to measure chemical gas contaminants within semiconductor equipment and clean room</title><description>A detector disc includes a disc body having a bottom disc and a top cover, the top cover including a first aperture. A sensor is disposed inside the disc body and positioned to be exposed to an external environment via the first aperture in the top cover. The solid state sensor is adapted to detect levels of chemical gas contaminants and output a detection signal based on detected levels of the chemical gas contaminants. A microcontroller is disposed on the PCB and adapted to generate measurement data from the detected levels of the chemical gas contaminants embodied within the detection signal. A wireless communication circuit is disposed on the PCB, the wireless communication circuit adapted to transmit the measurement data wirelessly to a wireless access point device.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyjEKwlAMgOEuDqLeIR5A0LYOjiKKo0PBscY02gfvJfUlxeuL4AGc_uH7p8XtotnxHhm6YASukBhtzAzUcwqEEZ5oQCqOKQiKG7yD90HAvq7SjeSagV9jGBKLA0oHFBkFsmqaF5MHRuPFr7NieTo2h_OKB23ZBiQW9ra5luuy3lS7eruv_nk-CW8-BQ</recordid><startdate>20240401</startdate><enddate>20240401</enddate><creator>HOLEYANNAVAR, DEVENDRA CHANNAPPA</creator><creator>HUDGENS, JEFFREY C</creator><creator>NARA, SHIVARAJ MANJUNATH</creator><creator>RAMACHANDRAIAH, ARUNKUMAR</creator><creator>REUTER, PAUL B</creator><creator>HRUZEK, DEAN C</creator><scope>EVB</scope></search><sort><creationdate>20240401</creationdate><title>Portable disc to measure chemical gas contaminants within semiconductor equipment and clean room</title><author>HOLEYANNAVAR, DEVENDRA CHANNAPPA ; HUDGENS, JEFFREY C ; NARA, SHIVARAJ MANJUNATH ; RAMACHANDRAIAH, ARUNKUMAR ; REUTER, PAUL B ; HRUZEK, DEAN C</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TW202413945A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HOLEYANNAVAR, DEVENDRA CHANNAPPA</creatorcontrib><creatorcontrib>HUDGENS, JEFFREY C</creatorcontrib><creatorcontrib>NARA, SHIVARAJ MANJUNATH</creatorcontrib><creatorcontrib>RAMACHANDRAIAH, ARUNKUMAR</creatorcontrib><creatorcontrib>REUTER, PAUL B</creatorcontrib><creatorcontrib>HRUZEK, DEAN C</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HOLEYANNAVAR, DEVENDRA CHANNAPPA</au><au>HUDGENS, JEFFREY C</au><au>NARA, SHIVARAJ MANJUNATH</au><au>RAMACHANDRAIAH, ARUNKUMAR</au><au>REUTER, PAUL B</au><au>HRUZEK, DEAN C</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Portable disc to measure chemical gas contaminants within semiconductor equipment and clean room</title><date>2024-04-01</date><risdate>2024</risdate><abstract>A detector disc includes a disc body having a bottom disc and a top cover, the top cover including a first aperture. A sensor is disposed inside the disc body and positioned to be exposed to an external environment via the first aperture in the top cover. The solid state sensor is adapted to detect levels of chemical gas contaminants and output a detection signal based on detected levels of the chemical gas contaminants. A microcontroller is disposed on the PCB and adapted to generate measurement data from the detected levels of the chemical gas contaminants embodied within the detection signal. A wireless communication circuit is disposed on the PCB, the wireless communication circuit adapted to transmit the measurement data wirelessly to a wireless access point device.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_TW202413945A |
source | esp@cenet |
subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SEMICONDUCTOR DEVICES TESTING |
title | Portable disc to measure chemical gas contaminants within semiconductor equipment and clean room |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T21%3A33%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HOLEYANNAVAR,%20DEVENDRA%20CHANNAPPA&rft.date=2024-04-01&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ETW202413945A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |