Semiconductor device and fabrication method thereof

Provided are devices with replacement structures and methods for fabricating such structures. A method includes forming a layer over a semiconductor material having a top surface in a horizontal plane; forming a dummy structure over the layer, wherein the dummy structure has sidewall, wherein the du...

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Bibliographische Detailangaben
Hauptverfasser: CHIU, CHIHUNG, CHEN, CHEN-PING, CHEN, CHAONG, LIN, SHIH-YAO, LIN, CHIH-HAN, CHANG, MINGING, KAO, KUEI-YU
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:Provided are devices with replacement structures and methods for fabricating such structures. A method includes forming a layer over a semiconductor material having a top surface in a horizontal plane; forming a dummy structure over the layer, wherein the dummy structure has sidewall, wherein the dummy structure lies directly over a first region of the layer and over a first region of the semiconductor material under the first region of the layer, and wherein the dummy structure does not lie directly over a second region of the layer or over a second region of the semiconductor material under the second region of the layer, and removing the second region of the layer and forming a side edge of the first region of the layer, wherein the side edge forms an angle of from 90 to 100 degrees with the horizontal plane.