System and method of aging test for thermal interface material and electronic device testing apparatus comprising the system

The present invention relates to an aging test system and an aging test method for a thermal interface material and an electronic device testing apparatus having the system, wherein a controller controls a movable carrier to move to a high temperature generating device so that the thermal interface...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ZENG, YI-SHI, WU, XIN-YI, OUYANG, QIN-YI
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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