Impedance measurement for a haptic load
In some implementations, a measurement circuit may drive, using a first transistor, a first node of a haptic load. The measurement circuit may trigger a first comparator when a voltage driving the haptic load satisfies a first condition. The first comparator may have a first node connected, in paral...
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| creator | RUTKOWSKI, JOSEPH DALE SALAZAR, NATHANIEL JAY T SHEN, LIANG-GUO ZAZZERA, JOSHUA |
| description | In some implementations, a measurement circuit may drive, using a first transistor, a first node of a haptic load. The measurement circuit may trigger a first comparator when a voltage driving the haptic load satisfies a first condition. The first comparator may have a first node connected, in parallel, to a drain of a second transistor and may have a second node connected to the first node of the haptic load. Additionally, the second transistor may have a gate connected to a gate of the first transistor and may have the drain connected to a first reference current. |
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| language | chi ; eng |
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| subjects | ALARM SYSTEMS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES ORDER TELEGRAPHS PHYSICS SIGNALLING SIGNALLING OR CALLING SYSTEMS TESTING |
| title | Impedance measurement for a haptic load |
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