Testing system and tesint method for image processing algorithm
A testing system for an image processing algorithm including a control unit, an image processing device, an image processing hardware, and a testing device is disclosed. The control unit provides an original image and parameter values. The image processing device obtains the original image and the p...
Gespeichert in:
Hauptverfasser: | , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | LU, CHI-HENG LIANG, CHING-HUNG HSU, CHIA-LIANG HSU, MINGN WANG, CHANG-YU |
description | A testing system for an image processing algorithm including a control unit, an image processing device, an image processing hardware, and a testing device is disclosed. The control unit provides an original image and parameter values. The image processing device obtains the original image and the parameter values, and drives the image processing hardware to perform a first image processing procedure to the original image based on the parameter values to generate a hardware-processed image. The testing device obtains the original image, the parameter values and the hardware-processed image, performs a second image processing procedure, through executing a simulation software, to the original image based on the parameter values to generate a software-processed image. And, the testing device compares the hardware-processed image and the software-processed image through executing a testing software to generate a comparing result that represents a pixel difference of the hardware-processed image and the software- |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TW202232430A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TW202232430A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TW202232430A3</originalsourceid><addsrcrecordid>eNqNykEKwjAQBdBsXIh6h_EAhZK4FxGlBwi4LKH9TQNNJmRm4-1F8ACu3ubtzdVDNJVI8hZFplBmUkgqShm68kwLN0o5RFBtPEHku8MWuSVd89HslrAJTj8P5vx8-PvQofIIqWFCgY7-ZXtrnb24_ub-OR-51TFa</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Testing system and tesint method for image processing algorithm</title><source>esp@cenet</source><creator>LU, CHI-HENG ; LIANG, CHING-HUNG ; HSU, CHIA-LIANG ; HSU, MINGN ; WANG, CHANG-YU</creator><creatorcontrib>LU, CHI-HENG ; LIANG, CHING-HUNG ; HSU, CHIA-LIANG ; HSU, MINGN ; WANG, CHANG-YU</creatorcontrib><description>A testing system for an image processing algorithm including a control unit, an image processing device, an image processing hardware, and a testing device is disclosed. The control unit provides an original image and parameter values. The image processing device obtains the original image and the parameter values, and drives the image processing hardware to perform a first image processing procedure to the original image based on the parameter values to generate a hardware-processed image. The testing device obtains the original image, the parameter values and the hardware-processed image, performs a second image processing procedure, through executing a simulation software, to the original image based on the parameter values to generate a software-processed image. And, the testing device compares the hardware-processed image and the software-processed image through executing a testing software to generate a comparing result that represents a pixel difference of the hardware-processed image and the software-</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220816&DB=EPODOC&CC=TW&NR=202232430A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220816&DB=EPODOC&CC=TW&NR=202232430A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LU, CHI-HENG</creatorcontrib><creatorcontrib>LIANG, CHING-HUNG</creatorcontrib><creatorcontrib>HSU, CHIA-LIANG</creatorcontrib><creatorcontrib>HSU, MINGN</creatorcontrib><creatorcontrib>WANG, CHANG-YU</creatorcontrib><title>Testing system and tesint method for image processing algorithm</title><description>A testing system for an image processing algorithm including a control unit, an image processing device, an image processing hardware, and a testing device is disclosed. The control unit provides an original image and parameter values. The image processing device obtains the original image and the parameter values, and drives the image processing hardware to perform a first image processing procedure to the original image based on the parameter values to generate a hardware-processed image. The testing device obtains the original image, the parameter values and the hardware-processed image, performs a second image processing procedure, through executing a simulation software, to the original image based on the parameter values to generate a software-processed image. And, the testing device compares the hardware-processed image and the software-processed image through executing a testing software to generate a comparing result that represents a pixel difference of the hardware-processed image and the software-</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNykEKwjAQBdBsXIh6h_EAhZK4FxGlBwi4LKH9TQNNJmRm4-1F8ACu3ubtzdVDNJVI8hZFplBmUkgqShm68kwLN0o5RFBtPEHku8MWuSVd89HslrAJTj8P5vx8-PvQofIIqWFCgY7-ZXtrnb24_ub-OR-51TFa</recordid><startdate>20220816</startdate><enddate>20220816</enddate><creator>LU, CHI-HENG</creator><creator>LIANG, CHING-HUNG</creator><creator>HSU, CHIA-LIANG</creator><creator>HSU, MINGN</creator><creator>WANG, CHANG-YU</creator><scope>EVB</scope></search><sort><creationdate>20220816</creationdate><title>Testing system and tesint method for image processing algorithm</title><author>LU, CHI-HENG ; LIANG, CHING-HUNG ; HSU, CHIA-LIANG ; HSU, MINGN ; WANG, CHANG-YU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TW202232430A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2022</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>LU, CHI-HENG</creatorcontrib><creatorcontrib>LIANG, CHING-HUNG</creatorcontrib><creatorcontrib>HSU, CHIA-LIANG</creatorcontrib><creatorcontrib>HSU, MINGN</creatorcontrib><creatorcontrib>WANG, CHANG-YU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LU, CHI-HENG</au><au>LIANG, CHING-HUNG</au><au>HSU, CHIA-LIANG</au><au>HSU, MINGN</au><au>WANG, CHANG-YU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Testing system and tesint method for image processing algorithm</title><date>2022-08-16</date><risdate>2022</risdate><abstract>A testing system for an image processing algorithm including a control unit, an image processing device, an image processing hardware, and a testing device is disclosed. The control unit provides an original image and parameter values. The image processing device obtains the original image and the parameter values, and drives the image processing hardware to perform a first image processing procedure to the original image based on the parameter values to generate a hardware-processed image. The testing device obtains the original image, the parameter values and the hardware-processed image, performs a second image processing procedure, through executing a simulation software, to the original image based on the parameter values to generate a software-processed image. And, the testing device compares the hardware-processed image and the software-processed image through executing a testing software to generate a comparing result that represents a pixel difference of the hardware-processed image and the software-</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | chi ; eng |
recordid | cdi_epo_espacenet_TW202232430A |
source | esp@cenet |
subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS |
title | Testing system and tesint method for image processing algorithm |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T16%3A08%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LU,%20CHI-HENG&rft.date=2022-08-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ETW202232430A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |