Segregating defects based on computer-aided design (CAD) identifiers associated with the defects

For each defect in a set of defects, the defect may be associated with a defect attribute constructed from a set of computer-aided design (CAD) identifiers associated with polygons in an integrated circuit (IC) design that overlap with a defect area of the defect. Next, the set of defects may be seg...

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Hauptverfasser:	OBERAI, ANKUSH BHARATI, AGASHE, KIRAN U
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SEMICONDUCTOR DEVICES TESTING
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