Probe card

A probe card for coupling a test machine and a number of probe needles. The probe card comprises a circuit board having a first surface and a second surface on both sides in the axial direction. The circuit board has a plurality of first contacts and a plurality of second contacts. The first contact...

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Hauptverfasser:	LU, YEN-HUNG, LEE, TSUNG-JUN, CHEN, CHUNI, LIN, CHANGNG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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creator	LU, YEN-HUNG LEE, TSUNG-JUN CHEN, CHUNI LIN, CHANGNG
description	A probe card for coupling a test machine and a number of probe needles. The probe card comprises a circuit board having a first surface and a second surface on both sides in the axial direction. The circuit board has a plurality of first contacts and a plurality of second contacts. The first contacts are electrically connected to the test machine and the second contacts are electrically connected to the probe needles. The first surface faces toward the test machine and the second surface faces toward the probe needles. The circuit board is provided with a cavity on the second surface and an electronic component is arranged in the cavity. By providing a cavity on the second surface of the circuit board leads to a larger usable surface.
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language	chi ; eng
recordid	cdi_epo_espacenet_TW202124974A
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subjects	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
title	Probe card
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