Calibration circuit and semiconductor apparatus including the same

Calibration circuit and semiconductor apparatus including the same

A calibration circuit includes a reference resistor leg, a calibration code generation circuit, and an emphasis circuit. The reference resistor leg is coupled to an external reference resistor through a reference resistor node, and changes a voltage level of the reference resistor node based on a ca...

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1. Verfasser: AHN, JUNG-IL
Format: Patent
Sprache:chi ; eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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description A calibration circuit includes a reference resistor leg, a calibration code generation circuit, and an emphasis circuit. The reference resistor leg is coupled to an external reference resistor through a reference resistor node, and changes a voltage level of the reference resistor node based on a calibration code. The emphasis circuit accelerates a voltage level change of the reference resistor node based on the calibration code.
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language chi ; eng
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Calibration circuit and semiconductor apparatus including the same
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