Method of detecting and marking defect

A method of detecting and marking defect is provided. A detecting and marking system applied to this method controls a 2D camera module to shoot the difference regions of a test object for obtaining a detection 2D image of each region, executes a defect-detecting process on each detection 2D image f...

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Hauptverfasser:	CHEN, CHENG-LUNG, NGUYEN, XUANLOC, TAI, WENIH
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING GYROSCOPIC INSTRUMENTS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING DISTANCES, LEVELS OR BEARINGS NAVIGATION PHOTOGRAMMETRY OR VIDEOGRAMMETRY PHYSICS SURVEYING TESTING
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creator	CHEN, CHENG-LUNG NGUYEN, XUANLOC TAI, WENIH
description	A method of detecting and marking defect is provided. A detecting and marking system applied to this method controls a 2D camera module to shoot the difference regions of a test object for obtaining a detection 2D image of each region, executes a defect-detecting process on each detection 2D image for determining whether there is any defect in any region, controls a 3D camera module to shoot the region if there is the defect in the region for obtaining appearance 3D data of the region, measures a 3D position of the defect according to the appearance 3D data, and controls a marking module to mark the defect at the 3D position.
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subjects	CALCULATING COMPUTING COUNTING GYROSCOPIC INSTRUMENTS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING DISTANCES, LEVELS OR BEARINGS NAVIGATION PHOTOGRAMMETRY OR VIDEOGRAMMETRY PHYSICS SURVEYING TESTING
title	Method of detecting and marking defect
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