Systems and methods for reducing resist model prediction errors

Described herein is a method for calibrating a resist model. The method includes the steps of: generating a modeled resist contour of a resist structure based on a simulated aerial image of the resist structure and parameters of the resist model, and predicting a metrology contour of the resist stru...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WUISTER, SANDER FREDERIK, RIO, DAVID MARIE, KOOIMAN, MARLEEN
Format: Patent
Sprache:chi ; eng
Schlagworte:
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