Protective film composition and method of manufacturing semiconductor package by using the same

A protective film composition includes a polymer having the following formula: each of a, b, and c is a mole fraction; a+b+c=1; 0.05 ≤ a/(a+b+c) ≤ 0.3; 0.1 ≤ b/(a+b+c) ≤ 0.6; 0.1 ≤ c/(a+b+c) ≤ 0.6; each of R1, R2, and R3 is a hydrogen atom or a methyl group; R4 is a hydrogen atom, a butyrolactonyl g...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: OH, KYEONG-IL, KANG, CHANG-KUN, KIM, JAE-HYUN, EUM, MYOUNGUL, LEE, HYE-KYOUNG, OH, SEUNG-KEUN, LEE, CHI-HWAN
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator OH, KYEONG-IL
KANG, CHANG-KUN
KIM, JAE-HYUN
EUM, MYOUNGUL
LEE, HYE-KYOUNG
OH, SEUNG-KEUN
LEE, CHI-HWAN
description A protective film composition includes a polymer having the following formula: each of a, b, and c is a mole fraction; a+b+c=1; 0.05 ≤ a/(a+b+c) ≤ 0.3; 0.1 ≤ b/(a+b+c) ≤ 0.6; 0.1 ≤ c/(a+b+c) ≤ 0.6; each of R1, R2, and R3 is a hydrogen atom or a methyl group; R4 is a hydrogen atom, a butyrolactonyl group, or a substituted or unsubstituted C3 to C30 alicyclic hydrocarbon group; and R5 is a substituted or unsubstituted C6 to C30 linear or cyclic hydrocarbon group. A method of manufacturing a semiconductor package includes forming a sawing protective film on a semiconductor structure by using the protective film composition and sawing the sawing protective film and the semiconductor structure from the sawing protective film.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TW201934683A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TW201934683A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TW201934683A3</originalsourceid><addsrcrecordid>eNqNizEKAjEQANNYiPqH9QGCGhEtRRRLiwPLsOY2d8FLNiQbwd-r4AOsppiZsTLXzEJW_JPA-SGA5ZC4ePEcAWMLgaTnFthBwFgdWqnZxw4KBW85ttUKZ0hoH9gR3F9Qy1dLT1Aw0FSNHA6FZj9O1Px8ao6XBSU2VD4fRRLT3NbL1V5vtjt90P80b-BmPbM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Protective film composition and method of manufacturing semiconductor package by using the same</title><source>esp@cenet</source><creator>OH, KYEONG-IL ; KANG, CHANG-KUN ; KIM, JAE-HYUN ; EUM, MYOUNGUL ; LEE, HYE-KYOUNG ; OH, SEUNG-KEUN ; LEE, CHI-HWAN</creator><creatorcontrib>OH, KYEONG-IL ; KANG, CHANG-KUN ; KIM, JAE-HYUN ; EUM, MYOUNGUL ; LEE, HYE-KYOUNG ; OH, SEUNG-KEUN ; LEE, CHI-HWAN</creatorcontrib><description>A protective film composition includes a polymer having the following formula: each of a, b, and c is a mole fraction; a+b+c=1; 0.05 ≤ a/(a+b+c) ≤ 0.3; 0.1 ≤ b/(a+b+c) ≤ 0.6; 0.1 ≤ c/(a+b+c) ≤ 0.6; each of R1, R2, and R3 is a hydrogen atom or a methyl group; R4 is a hydrogen atom, a butyrolactonyl group, or a substituted or unsubstituted C3 to C30 alicyclic hydrocarbon group; and R5 is a substituted or unsubstituted C6 to C30 linear or cyclic hydrocarbon group. A method of manufacturing a semiconductor package includes forming a sawing protective film on a semiconductor structure by using the protective film composition and sawing the sawing protective film and the semiconductor structure from the sawing protective film.</description><language>chi ; eng</language><subject>ADHESIVES ; BASIC ELECTRIC ELEMENTS ; CHEMICAL PAINT OR INK REMOVERS ; CHEMISTRY ; COATING COMPOSITIONS, e.g. PAINTS, VARNISHES ORLACQUERS ; CORRECTING FLUIDS ; DYES ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; FILLING PASTES ; INKS ; METALLURGY ; MISCELLANEOUS APPLICATIONS OF MATERIALS ; MISCELLANEOUS COMPOSITIONS ; NATURAL RESINS ; PAINTS ; PASTES OR SOLIDS FOR COLOURING OR PRINTING ; POLISHES ; SEMICONDUCTOR DEVICES ; USE OF MATERIALS THEREFOR ; WOODSTAINS</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190901&amp;DB=EPODOC&amp;CC=TW&amp;NR=201934683A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190901&amp;DB=EPODOC&amp;CC=TW&amp;NR=201934683A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OH, KYEONG-IL</creatorcontrib><creatorcontrib>KANG, CHANG-KUN</creatorcontrib><creatorcontrib>KIM, JAE-HYUN</creatorcontrib><creatorcontrib>EUM, MYOUNGUL</creatorcontrib><creatorcontrib>LEE, HYE-KYOUNG</creatorcontrib><creatorcontrib>OH, SEUNG-KEUN</creatorcontrib><creatorcontrib>LEE, CHI-HWAN</creatorcontrib><title>Protective film composition and method of manufacturing semiconductor package by using the same</title><description>A protective film composition includes a polymer having the following formula: each of a, b, and c is a mole fraction; a+b+c=1; 0.05 ≤ a/(a+b+c) ≤ 0.3; 0.1 ≤ b/(a+b+c) ≤ 0.6; 0.1 ≤ c/(a+b+c) ≤ 0.6; each of R1, R2, and R3 is a hydrogen atom or a methyl group; R4 is a hydrogen atom, a butyrolactonyl group, or a substituted or unsubstituted C3 to C30 alicyclic hydrocarbon group; and R5 is a substituted or unsubstituted C6 to C30 linear or cyclic hydrocarbon group. A method of manufacturing a semiconductor package includes forming a sawing protective film on a semiconductor structure by using the protective film composition and sawing the sawing protective film and the semiconductor structure from the sawing protective film.</description><subject>ADHESIVES</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CHEMICAL PAINT OR INK REMOVERS</subject><subject>CHEMISTRY</subject><subject>COATING COMPOSITIONS, e.g. PAINTS, VARNISHES ORLACQUERS</subject><subject>CORRECTING FLUIDS</subject><subject>DYES</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>FILLING PASTES</subject><subject>INKS</subject><subject>METALLURGY</subject><subject>MISCELLANEOUS APPLICATIONS OF MATERIALS</subject><subject>MISCELLANEOUS COMPOSITIONS</subject><subject>NATURAL RESINS</subject><subject>PAINTS</subject><subject>PASTES OR SOLIDS FOR COLOURING OR PRINTING</subject><subject>POLISHES</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>USE OF MATERIALS THEREFOR</subject><subject>WOODSTAINS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNizEKAjEQANNYiPqH9QGCGhEtRRRLiwPLsOY2d8FLNiQbwd-r4AOsppiZsTLXzEJW_JPA-SGA5ZC4ePEcAWMLgaTnFthBwFgdWqnZxw4KBW85ttUKZ0hoH9gR3F9Qy1dLT1Aw0FSNHA6FZj9O1Px8ao6XBSU2VD4fRRLT3NbL1V5vtjt90P80b-BmPbM</recordid><startdate>20190901</startdate><enddate>20190901</enddate><creator>OH, KYEONG-IL</creator><creator>KANG, CHANG-KUN</creator><creator>KIM, JAE-HYUN</creator><creator>EUM, MYOUNGUL</creator><creator>LEE, HYE-KYOUNG</creator><creator>OH, SEUNG-KEUN</creator><creator>LEE, CHI-HWAN</creator><scope>EVB</scope></search><sort><creationdate>20190901</creationdate><title>Protective film composition and method of manufacturing semiconductor package by using the same</title><author>OH, KYEONG-IL ; KANG, CHANG-KUN ; KIM, JAE-HYUN ; EUM, MYOUNGUL ; LEE, HYE-KYOUNG ; OH, SEUNG-KEUN ; LEE, CHI-HWAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TW201934683A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2019</creationdate><topic>ADHESIVES</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CHEMICAL PAINT OR INK REMOVERS</topic><topic>CHEMISTRY</topic><topic>COATING COMPOSITIONS, e.g. PAINTS, VARNISHES ORLACQUERS</topic><topic>CORRECTING FLUIDS</topic><topic>DYES</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>FILLING PASTES</topic><topic>INKS</topic><topic>METALLURGY</topic><topic>MISCELLANEOUS APPLICATIONS OF MATERIALS</topic><topic>MISCELLANEOUS COMPOSITIONS</topic><topic>NATURAL RESINS</topic><topic>PAINTS</topic><topic>PASTES OR SOLIDS FOR COLOURING OR PRINTING</topic><topic>POLISHES</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>USE OF MATERIALS THEREFOR</topic><topic>WOODSTAINS</topic><toplevel>online_resources</toplevel><creatorcontrib>OH, KYEONG-IL</creatorcontrib><creatorcontrib>KANG, CHANG-KUN</creatorcontrib><creatorcontrib>KIM, JAE-HYUN</creatorcontrib><creatorcontrib>EUM, MYOUNGUL</creatorcontrib><creatorcontrib>LEE, HYE-KYOUNG</creatorcontrib><creatorcontrib>OH, SEUNG-KEUN</creatorcontrib><creatorcontrib>LEE, CHI-HWAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OH, KYEONG-IL</au><au>KANG, CHANG-KUN</au><au>KIM, JAE-HYUN</au><au>EUM, MYOUNGUL</au><au>LEE, HYE-KYOUNG</au><au>OH, SEUNG-KEUN</au><au>LEE, CHI-HWAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Protective film composition and method of manufacturing semiconductor package by using the same</title><date>2019-09-01</date><risdate>2019</risdate><abstract>A protective film composition includes a polymer having the following formula: each of a, b, and c is a mole fraction; a+b+c=1; 0.05 ≤ a/(a+b+c) ≤ 0.3; 0.1 ≤ b/(a+b+c) ≤ 0.6; 0.1 ≤ c/(a+b+c) ≤ 0.6; each of R1, R2, and R3 is a hydrogen atom or a methyl group; R4 is a hydrogen atom, a butyrolactonyl group, or a substituted or unsubstituted C3 to C30 alicyclic hydrocarbon group; and R5 is a substituted or unsubstituted C6 to C30 linear or cyclic hydrocarbon group. A method of manufacturing a semiconductor package includes forming a sawing protective film on a semiconductor structure by using the protective film composition and sawing the sawing protective film and the semiconductor structure from the sawing protective film.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_TW201934683A
source esp@cenet
subjects ADHESIVES
BASIC ELECTRIC ELEMENTS
CHEMICAL PAINT OR INK REMOVERS
CHEMISTRY
COATING COMPOSITIONS, e.g. PAINTS, VARNISHES ORLACQUERS
CORRECTING FLUIDS
DYES
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
FILLING PASTES
INKS
METALLURGY
MISCELLANEOUS APPLICATIONS OF MATERIALS
MISCELLANEOUS COMPOSITIONS
NATURAL RESINS
PAINTS
PASTES OR SOLIDS FOR COLOURING OR PRINTING
POLISHES
SEMICONDUCTOR DEVICES
USE OF MATERIALS THEREFOR
WOODSTAINS
title Protective film composition and method of manufacturing semiconductor package by using the same
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-13T13%3A22%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=OH,%20KYEONG-IL&rft.date=2019-09-01&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ETW201934683A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true