Electrical probe and jig for the electrical probe

An electrical probe includes a base, a head and at least one terminal probe. The base includes a main portion and at least one positioning portion, and the positioning portion protrudes from the main portion. The head is detachably disposed on the main portion. The head has an equipping surface loca...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: LIU, MING-TSUNG, HSU, KUO-YEN, HSU, HSUANG
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator LIU, MING-TSUNG
HSU, KUO-YEN
HSU, HSUANG
description An electrical probe includes a base, a head and at least one terminal probe. The base includes a main portion and at least one positioning portion, and the positioning portion protrudes from the main portion. The head is detachably disposed on the main portion. The head has an equipping surface located on the side away from the main portion. The equipping surface has an outer edge located on the side away from the axis of the main portion, and the positioning portion protrudes from the outer edge. The terminal probe has a plurality of pins, and is disposed on the equipping surface. The projection of these pins on the equipping surface and its extended surface is surrounded by the equipping surface.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TW201908736A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TW201908736A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TW201908736A3</originalsourceid><addsrcrecordid>eNrjZDB0zUlNLinKTE7MUSgoyk9KVUjMS1HIykxXSMsvUijJSFVIRVPAw8CalphTnMoLpbkZFN1cQ5w9dFML8uNTiwsSk1PzUkviQ8KNDAwtDSzMjc0cjYlRAwBjXCtp</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Electrical probe and jig for the electrical probe</title><source>esp@cenet</source><creator>LIU, MING-TSUNG ; HSU, KUO-YEN ; HSU, HSUANG</creator><creatorcontrib>LIU, MING-TSUNG ; HSU, KUO-YEN ; HSU, HSUANG</creatorcontrib><description>An electrical probe includes a base, a head and at least one terminal probe. The base includes a main portion and at least one positioning portion, and the positioning portion protrudes from the main portion. The head is detachably disposed on the main portion. The head has an equipping surface located on the side away from the main portion. The equipping surface has an outer edge located on the side away from the axis of the main portion, and the positioning portion protrudes from the outer edge. The terminal probe has a plurality of pins, and is disposed on the equipping surface. The projection of these pins on the equipping surface and its extended surface is surrounded by the equipping surface.</description><language>chi ; eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190301&amp;DB=EPODOC&amp;CC=TW&amp;NR=201908736A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190301&amp;DB=EPODOC&amp;CC=TW&amp;NR=201908736A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LIU, MING-TSUNG</creatorcontrib><creatorcontrib>HSU, KUO-YEN</creatorcontrib><creatorcontrib>HSU, HSUANG</creatorcontrib><title>Electrical probe and jig for the electrical probe</title><description>An electrical probe includes a base, a head and at least one terminal probe. The base includes a main portion and at least one positioning portion, and the positioning portion protrudes from the main portion. The head is detachably disposed on the main portion. The head has an equipping surface located on the side away from the main portion. The equipping surface has an outer edge located on the side away from the axis of the main portion, and the positioning portion protrudes from the outer edge. The terminal probe has a plurality of pins, and is disposed on the equipping surface. The projection of these pins on the equipping surface and its extended surface is surrounded by the equipping surface.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB0zUlNLinKTE7MUSgoyk9KVUjMS1HIykxXSMsvUijJSFVIRVPAw8CalphTnMoLpbkZFN1cQ5w9dFML8uNTiwsSk1PzUkviQ8KNDAwtDSzMjc0cjYlRAwBjXCtp</recordid><startdate>20190301</startdate><enddate>20190301</enddate><creator>LIU, MING-TSUNG</creator><creator>HSU, KUO-YEN</creator><creator>HSU, HSUANG</creator><scope>EVB</scope></search><sort><creationdate>20190301</creationdate><title>Electrical probe and jig for the electrical probe</title><author>LIU, MING-TSUNG ; HSU, KUO-YEN ; HSU, HSUANG</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TW201908736A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2019</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LIU, MING-TSUNG</creatorcontrib><creatorcontrib>HSU, KUO-YEN</creatorcontrib><creatorcontrib>HSU, HSUANG</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LIU, MING-TSUNG</au><au>HSU, KUO-YEN</au><au>HSU, HSUANG</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Electrical probe and jig for the electrical probe</title><date>2019-03-01</date><risdate>2019</risdate><abstract>An electrical probe includes a base, a head and at least one terminal probe. The base includes a main portion and at least one positioning portion, and the positioning portion protrudes from the main portion. The head is detachably disposed on the main portion. The head has an equipping surface located on the side away from the main portion. The equipping surface has an outer edge located on the side away from the axis of the main portion, and the positioning portion protrudes from the outer edge. The terminal probe has a plurality of pins, and is disposed on the equipping surface. The projection of these pins on the equipping surface and its extended surface is surrounded by the equipping surface.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language chi ; eng
recordid cdi_epo_espacenet_TW201908736A
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Electrical probe and jig for the electrical probe
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T07%3A40%3A55IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LIU,%20MING-TSUNG&rft.date=2019-03-01&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ETW201908736A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true