Wear-out monitor device

The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indic...

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Hauptverfasser:	O'DONNELL, ALAN J, MANNING, KEVIN B, CLARKE, DAVID J, BOLAND, DAVID, COYNE, EDWARD JOHN, O'DWYER, THOMAS G, BRADLEY, SHAUN, HEFFERNAN, COLM PATRICK, LOOBY, MICHAEL A, AHERNE, DAVID, FORDE, MARK
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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creator	O'DONNELL, ALAN J MANNING, KEVIN B CLARKE, DAVID J BOLAND, DAVID COYNE, EDWARD JOHN O'DWYER, THOMAS G BRADLEY, SHAUN HEFFERNAN, COLM PATRICK LOOBY, MICHAEL A AHERNE, DAVID FORDE, MARK
description	The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
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fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TW201738984A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TW201738984A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TW201738984A3</originalsourceid><addsrcrecordid>eNrjZBAPT00s0s0vLVHIzc_LLMkvUkhJLctMTuVhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfEh4UYGhubGFpYWJo7GxKgBAMfnIhI</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Wear-out monitor device</title><source>esp@cenet</source><creator>O'DONNELL, ALAN J ; MANNING, KEVIN B ; CLARKE, DAVID J ; BOLAND, DAVID ; COYNE, EDWARD JOHN ; O'DWYER, THOMAS G ; BRADLEY, SHAUN ; HEFFERNAN, COLM PATRICK ; LOOBY, MICHAEL A ; AHERNE, DAVID ; FORDE, MARK</creator><creatorcontrib>O'DONNELL, ALAN J ; MANNING, KEVIN B ; CLARKE, DAVID J ; BOLAND, DAVID ; COYNE, EDWARD JOHN ; O'DWYER, THOMAS G ; BRADLEY, SHAUN ; HEFFERNAN, COLM PATRICK ; LOOBY, MICHAEL A ; AHERNE, DAVID ; FORDE, MARK</creatorcontrib><description>The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171101&DB=EPODOC&CC=TW&NR=201738984A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171101&DB=EPODOC&CC=TW&NR=201738984A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>O'DONNELL, ALAN J</creatorcontrib><creatorcontrib>MANNING, KEVIN B</creatorcontrib><creatorcontrib>CLARKE, DAVID J</creatorcontrib><creatorcontrib>BOLAND, DAVID</creatorcontrib><creatorcontrib>COYNE, EDWARD JOHN</creatorcontrib><creatorcontrib>O'DWYER, THOMAS G</creatorcontrib><creatorcontrib>BRADLEY, SHAUN</creatorcontrib><creatorcontrib>HEFFERNAN, COLM PATRICK</creatorcontrib><creatorcontrib>LOOBY, MICHAEL A</creatorcontrib><creatorcontrib>AHERNE, DAVID</creatorcontrib><creatorcontrib>FORDE, MARK</creatorcontrib><title>Wear-out monitor device</title><description>The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBAPT00s0s0vLVHIzc_LLMkvUkhJLctMTuVhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfEh4UYGhubGFpYWJo7GxKgBAMfnIhI</recordid><startdate>20171101</startdate><enddate>20171101</enddate><creator>O'DONNELL, ALAN J</creator><creator>MANNING, KEVIN B</creator><creator>CLARKE, DAVID J</creator><creator>BOLAND, DAVID</creator><creator>COYNE, EDWARD JOHN</creator><creator>O'DWYER, THOMAS G</creator><creator>BRADLEY, SHAUN</creator><creator>HEFFERNAN, COLM PATRICK</creator><creator>LOOBY, MICHAEL A</creator><creator>AHERNE, DAVID</creator><creator>FORDE, MARK</creator><scope>EVB</scope></search><sort><creationdate>20171101</creationdate><title>Wear-out monitor device</title><author>O'DONNELL, ALAN J ; MANNING, KEVIN B ; CLARKE, DAVID J ; BOLAND, DAVID ; COYNE, EDWARD JOHN ; O'DWYER, THOMAS G ; BRADLEY, SHAUN ; HEFFERNAN, COLM PATRICK ; LOOBY, MICHAEL A ; AHERNE, DAVID ; FORDE, MARK</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TW201738984A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2017</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>O'DONNELL, ALAN J</creatorcontrib><creatorcontrib>MANNING, KEVIN B</creatorcontrib><creatorcontrib>CLARKE, DAVID J</creatorcontrib><creatorcontrib>BOLAND, DAVID</creatorcontrib><creatorcontrib>COYNE, EDWARD JOHN</creatorcontrib><creatorcontrib>O'DWYER, THOMAS G</creatorcontrib><creatorcontrib>BRADLEY, SHAUN</creatorcontrib><creatorcontrib>HEFFERNAN, COLM PATRICK</creatorcontrib><creatorcontrib>LOOBY, MICHAEL A</creatorcontrib><creatorcontrib>AHERNE, DAVID</creatorcontrib><creatorcontrib>FORDE, MARK</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>O'DONNELL, ALAN J</au><au>MANNING, KEVIN B</au><au>CLARKE, DAVID J</au><au>BOLAND, DAVID</au><au>COYNE, EDWARD JOHN</au><au>O'DWYER, THOMAS G</au><au>BRADLEY, SHAUN</au><au>HEFFERNAN, COLM PATRICK</au><au>LOOBY, MICHAEL A</au><au>AHERNE, DAVID</au><au>FORDE, MARK</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Wear-out monitor device</title><date>2017-11-01</date><risdate>2017</risdate><abstract>The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.</abstract><oa>free_for_read</oa></addata></record>
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language	chi ; eng
recordid	cdi_epo_espacenet_TW201738984A
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subjects	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
title	Wear-out monitor device
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