System and method for noncontact sensing maximum open circuit voltage of photovoltaic semiconductors
An apparatus for noncontact sensing of a voltage response characteristic and/or maximum open-circuit voltage (MOCV) of photovoltaic semiconductor specimens includes a high intensity wide spectrum light source adapted to emit light through a conductive probe tip; the conductive probe tip is situated...
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| creator | HOWLAND, WILLIAM H |
| description | An apparatus for noncontact sensing of a voltage response characteristic and/or maximum open-circuit voltage (MOCV) of photovoltaic semiconductor specimens includes a high intensity wide spectrum light source adapted to emit light through a conductive probe tip; the conductive probe tip is situated in spatial relationship with a vacuum chuck to form a capacitive specimen wafer interrogation space upon which specimen wafers are located; the high intensity light source emits light through the conductive probe tip, said light impinges a specimen wafer located within the interrogation space, and voltage response across the probe tip, wafer interrogation space, and vacuum chuck is amplified and recorded. |
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| language | chi ; eng |
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| subjects | CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ELECTRICITY GENERATION GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-REDRADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, E.G. USINGPHOTOVOLTAIC [PV] MODULES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | System and method for noncontact sensing maximum open circuit voltage of photovoltaic semiconductors |
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