Testing method and system for fluctuation height of lens

The invention discloses a testing method and system for fluctuation height of lens. The testing method includes opening a light source module to transmit light to a lens to be tested, turning on an image retrieve module to retrieve the interference images or patterns of the lens to be tested, search...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	YEH, MAU-SHIUN, YANG, SHIH-WEI, LIN, CHERN-SHENG, FU, SHU-HSIEN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The invention discloses a testing method and system for fluctuation height of lens. The testing method includes opening a light source module to transmit light to a lens to be tested, turning on an image retrieve module to retrieve the interference images or patterns of the lens to be tested, searching a clear interference pattern of central interference pattern or an edge point of the most outer circle of the interference pattern based on a processing module, and calculating an enclosed area based on the processing module. The initial position is calculated through the processing module and central position of the lens to be tested, diameter of lens, at least one bright pattern coordinate, at least one dark pattern coordinate or the most bright and dark patterns of multiple interference patterns.