Techniques for improving extracted ion beam quality using high-transparency electrodes

Techniques for improving extracted ion beam quality using high-transparency electrodes are disclosed. In one particular exemplary embodiment, the techniques may be realized as an apparatus for ion implantation. The apparatus may comprise an ion source for generating an ion beam, wherein the ion sour...

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Hauptverfasser: SINCLAIR, FRANK, PLATOW, WILHELM, PURSER, KENNETH H, PATEL, SHARDUL, BUFF, JAMES, CHANEY, CRAIG R, KOO, BON-WOONG, LISCHER, D. JEFFREY, MAYUR, JAGTAP, RADOVANOV, SVETLANA, COBB, ERIC R, BENVENISTE, VICTOR M, BORICHEVSKY, STEVEN
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creator SINCLAIR, FRANK
PLATOW, WILHELM
PURSER, KENNETH H
PATEL, SHARDUL
BUFF, JAMES
CHANEY, CRAIG R
KOO, BON-WOONG
LISCHER, D. JEFFREY
MAYUR, JAGTAP
RADOVANOV, SVETLANA
COBB, ERIC R
BENVENISTE, VICTOR M
BORICHEVSKY, STEVEN
description Techniques for improving extracted ion beam quality using high-transparency electrodes are disclosed. In one particular exemplary embodiment, the techniques may be realized as an apparatus for ion implantation. The apparatus may comprise an ion source for generating an ion beam, wherein the ion source comprises a faceplate with an aperture for the ion beam to travel therethrough. The apparatus may also comprise a set of extraction electrodes comprising at least a suppression electrode and a high-transparency ground electrode, wherein the set of extraction electrodes may extract the ion beam from the ion source via the faceplate, and wherein the high-transparency ground electrode may be configured to optimize gas conductance between the suppression electrode and the high-transparency ground electrode for improved extracted ion beam quality.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TW201110183A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TW201110183A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TW201110183A3</originalsourceid><addsrcrecordid>eNqNyz8KwjAYh-EsDqLe4fMAhcYuriKKBwg6lpj-2gTSJM0fsbe3ggdwepfnXbO7gNLOTAWJeh_JjCH6l3ED4Z2jVBkdGe_oCTnSVKQ1eaaSvkCbQVeLcSnICKdmgoXK0XdIW7bqpU3Y_bph--tFnG8Vgm-xDAoOuRWPQ805r_mxOTX_mA-ReTqN</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Techniques for improving extracted ion beam quality using high-transparency electrodes</title><source>esp@cenet</source><creator>SINCLAIR, FRANK ; PLATOW, WILHELM ; PURSER, KENNETH H ; PATEL, SHARDUL ; BUFF, JAMES ; CHANEY, CRAIG R ; KOO, BON-WOONG ; LISCHER, D. JEFFREY ; MAYUR, JAGTAP ; RADOVANOV, SVETLANA ; COBB, ERIC R ; BENVENISTE, VICTOR M ; BORICHEVSKY, STEVEN</creator><creatorcontrib>SINCLAIR, FRANK ; PLATOW, WILHELM ; PURSER, KENNETH H ; PATEL, SHARDUL ; BUFF, JAMES ; CHANEY, CRAIG R ; KOO, BON-WOONG ; LISCHER, D. JEFFREY ; MAYUR, JAGTAP ; RADOVANOV, SVETLANA ; COBB, ERIC R ; BENVENISTE, VICTOR M ; BORICHEVSKY, STEVEN</creatorcontrib><description>Techniques for improving extracted ion beam quality using high-transparency electrodes are disclosed. In one particular exemplary embodiment, the techniques may be realized as an apparatus for ion implantation. The apparatus may comprise an ion source for generating an ion beam, wherein the ion source comprises a faceplate with an aperture for the ion beam to travel therethrough. The apparatus may also comprise a set of extraction electrodes comprising at least a suppression electrode and a high-transparency ground electrode, wherein the set of extraction electrodes may extract the ion beam from the ion source via the faceplate, and wherein the high-transparency ground electrode may be configured to optimize gas conductance between the suppression electrode and the high-transparency ground electrode for improved extracted ion beam quality.</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110316&amp;DB=EPODOC&amp;CC=TW&amp;NR=201110183A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110316&amp;DB=EPODOC&amp;CC=TW&amp;NR=201110183A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SINCLAIR, FRANK</creatorcontrib><creatorcontrib>PLATOW, WILHELM</creatorcontrib><creatorcontrib>PURSER, KENNETH H</creatorcontrib><creatorcontrib>PATEL, SHARDUL</creatorcontrib><creatorcontrib>BUFF, JAMES</creatorcontrib><creatorcontrib>CHANEY, CRAIG R</creatorcontrib><creatorcontrib>KOO, BON-WOONG</creatorcontrib><creatorcontrib>LISCHER, D. JEFFREY</creatorcontrib><creatorcontrib>MAYUR, JAGTAP</creatorcontrib><creatorcontrib>RADOVANOV, SVETLANA</creatorcontrib><creatorcontrib>COBB, ERIC R</creatorcontrib><creatorcontrib>BENVENISTE, VICTOR M</creatorcontrib><creatorcontrib>BORICHEVSKY, STEVEN</creatorcontrib><title>Techniques for improving extracted ion beam quality using high-transparency electrodes</title><description>Techniques for improving extracted ion beam quality using high-transparency electrodes are disclosed. In one particular exemplary embodiment, the techniques may be realized as an apparatus for ion implantation. The apparatus may comprise an ion source for generating an ion beam, wherein the ion source comprises a faceplate with an aperture for the ion beam to travel therethrough. The apparatus may also comprise a set of extraction electrodes comprising at least a suppression electrode and a high-transparency ground electrode, wherein the set of extraction electrodes may extract the ion beam from the ion source via the faceplate, and wherein the high-transparency ground electrode may be configured to optimize gas conductance between the suppression electrode and the high-transparency ground electrode for improved extracted ion beam quality.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyz8KwjAYh-EsDqLe4fMAhcYuriKKBwg6lpj-2gTSJM0fsbe3ggdwepfnXbO7gNLOTAWJeh_JjCH6l3ED4Z2jVBkdGe_oCTnSVKQ1eaaSvkCbQVeLcSnICKdmgoXK0XdIW7bqpU3Y_bph--tFnG8Vgm-xDAoOuRWPQ805r_mxOTX_mA-ReTqN</recordid><startdate>20110316</startdate><enddate>20110316</enddate><creator>SINCLAIR, FRANK</creator><creator>PLATOW, WILHELM</creator><creator>PURSER, KENNETH H</creator><creator>PATEL, SHARDUL</creator><creator>BUFF, JAMES</creator><creator>CHANEY, CRAIG R</creator><creator>KOO, BON-WOONG</creator><creator>LISCHER, D. JEFFREY</creator><creator>MAYUR, JAGTAP</creator><creator>RADOVANOV, SVETLANA</creator><creator>COBB, ERIC R</creator><creator>BENVENISTE, VICTOR M</creator><creator>BORICHEVSKY, STEVEN</creator><scope>EVB</scope></search><sort><creationdate>20110316</creationdate><title>Techniques for improving extracted ion beam quality using high-transparency electrodes</title><author>SINCLAIR, FRANK ; PLATOW, WILHELM ; PURSER, KENNETH H ; PATEL, SHARDUL ; BUFF, JAMES ; CHANEY, CRAIG R ; KOO, BON-WOONG ; LISCHER, D. JEFFREY ; MAYUR, JAGTAP ; RADOVANOV, SVETLANA ; COBB, ERIC R ; BENVENISTE, VICTOR M ; BORICHEVSKY, STEVEN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TW201110183A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2011</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>SINCLAIR, FRANK</creatorcontrib><creatorcontrib>PLATOW, WILHELM</creatorcontrib><creatorcontrib>PURSER, KENNETH H</creatorcontrib><creatorcontrib>PATEL, SHARDUL</creatorcontrib><creatorcontrib>BUFF, JAMES</creatorcontrib><creatorcontrib>CHANEY, CRAIG R</creatorcontrib><creatorcontrib>KOO, BON-WOONG</creatorcontrib><creatorcontrib>LISCHER, D. JEFFREY</creatorcontrib><creatorcontrib>MAYUR, JAGTAP</creatorcontrib><creatorcontrib>RADOVANOV, SVETLANA</creatorcontrib><creatorcontrib>COBB, ERIC R</creatorcontrib><creatorcontrib>BENVENISTE, VICTOR M</creatorcontrib><creatorcontrib>BORICHEVSKY, STEVEN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SINCLAIR, FRANK</au><au>PLATOW, WILHELM</au><au>PURSER, KENNETH H</au><au>PATEL, SHARDUL</au><au>BUFF, JAMES</au><au>CHANEY, CRAIG R</au><au>KOO, BON-WOONG</au><au>LISCHER, D. JEFFREY</au><au>MAYUR, JAGTAP</au><au>RADOVANOV, SVETLANA</au><au>COBB, ERIC R</au><au>BENVENISTE, VICTOR M</au><au>BORICHEVSKY, STEVEN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Techniques for improving extracted ion beam quality using high-transparency electrodes</title><date>2011-03-16</date><risdate>2011</risdate><abstract>Techniques for improving extracted ion beam quality using high-transparency electrodes are disclosed. In one particular exemplary embodiment, the techniques may be realized as an apparatus for ion implantation. The apparatus may comprise an ion source for generating an ion beam, wherein the ion source comprises a faceplate with an aperture for the ion beam to travel therethrough. The apparatus may also comprise a set of extraction electrodes comprising at least a suppression electrode and a high-transparency ground electrode, wherein the set of extraction electrodes may extract the ion beam from the ion source via the faceplate, and wherein the high-transparency ground electrode may be configured to optimize gas conductance between the suppression electrode and the high-transparency ground electrode for improved extracted ion beam quality.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
title Techniques for improving extracted ion beam quality using high-transparency electrodes
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