TCP handling apparatus

In a TCP handler (2), a carrier tape (5) whereupon a plurality of TCPs are formed is transferred, the carrier tape (5) is pressed to a probe card (8) having a probe (81) electrically connected to a test head (10), and a test pad of the TCP is connected to the probe (81) of the probe card (8). Thus,...

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Hauptverfasser:	MURANO, HISASHI, KANDA, NORIO
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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creator	MURANO, HISASHI KANDA, NORIO
description	In a TCP handler (2), a carrier tape (5) whereupon a plurality of TCPs are formed is transferred, the carrier tape (5) is pressed to a probe card (8) having a probe (81) electrically connected to a test head (10), and a test pad of the TCP is connected to the probe (81) of the probe card (8). Thus, the TCP handler successively tests the TCPs. The TCP handler (2) is provided with a pusher unit (3), which presses the carrier tape (5) to the probe card (8) while supporting the carrier tape (5); a pusher stage (4) for moving the pusher unit (3) in a carrier tape surface direction; a punch unit (26), which is arranged on a rear stage of the pusher unit (3) and punches a hole on the carrier tape (5) based on test result information; and a punch unit stage (261) for moving the punch unit (26) in the carrier tape surface direction.; The punch unit stage (261) moves the punch unit (26) based on information of a moving quantity of the pusher unit (3) along the carrier tape transfer direction by the pusher unit (4). Acc
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Thus, the TCP handler successively tests the TCPs. The TCP handler (2) is provided with a pusher unit (3), which presses the carrier tape (5) to the probe card (8) while supporting the carrier tape (5); a pusher stage (4) for moving the pusher unit (3) in a carrier tape surface direction; a punch unit (26), which is arranged on a rear stage of the pusher unit (3) and punches a hole on the carrier tape (5) based on test result information; and a punch unit stage (261) for moving the punch unit (26) in the carrier tape surface direction.; The punch unit stage (261) moves the punch unit (26) based on information of a moving quantity of the pusher unit (3) along the carrier tape transfer direction by the pusher unit (4). 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Thus, the TCP handler successively tests the TCPs. The TCP handler (2) is provided with a pusher unit (3), which presses the carrier tape (5) to the probe card (8) while supporting the carrier tape (5); a pusher stage (4) for moving the pusher unit (3) in a carrier tape surface direction; a punch unit (26), which is arranged on a rear stage of the pusher unit (3) and punches a hole on the carrier tape (5) based on test result information; and a punch unit stage (261) for moving the punch unit (26) in the carrier tape surface direction.; The punch unit stage (261) moves the punch unit (26) based on information of a moving quantity of the pusher unit (3) along the carrier tape transfer direction by the pusher unit (4). 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Thus, the TCP handler successively tests the TCPs. The TCP handler (2) is provided with a pusher unit (3), which presses the carrier tape (5) to the probe card (8) while supporting the carrier tape (5); a pusher stage (4) for moving the pusher unit (3) in a carrier tape surface direction; a punch unit (26), which is arranged on a rear stage of the pusher unit (3) and punches a hole on the carrier tape (5) based on test result information; and a punch unit stage (261) for moving the punch unit (26) in the carrier tape surface direction.; The punch unit stage (261) moves the punch unit (26) based on information of a moving quantity of the pusher unit (3) along the carrier tape transfer direction by the pusher unit (4). Acc</abstract><oa>free_for_read</oa></addata></record>
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language	chi ; eng
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subjects	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
title	TCP handling apparatus
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