System and method to qualify data capture

One disclosed embodiment may comprise a system (10, 120, 300) that includes a qualification system (12, 50, 102, 128) that qualifies data on an associated bus (14, 122, 152, 252, 304) for capture and provides a qualification signal as a function of at least one signal that describes a characteristic...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	AKKERMAN, RYAN LEE, JOHNSON, TYLER J, BENAVIDES, JOHN A
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page
container_issue
container_start_page
container_title
container_volume
creator	AKKERMAN, RYAN LEE JOHNSON, TYLER J BENAVIDES, JOHN A
description	One disclosed embodiment may comprise a system (10, 120, 300) that includes a qualification system (12, 50, 102, 128) that qualifies data on an associated bus (14, 122, 152, 252, 304) for capture and provides a qualification signal as a function of at least one signal that describes a characteristic of the data on the associated bus (14, 122, 152, 252, 304). A data capture system (16, 132, 250) stores qualified data from the associated bus (14, 122, 152, 252, 304) based on the qualification signal and a trigger signal, the trigger signal defining a capture session.
format	Patent
fullrecord	<record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_TW200634506A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>TW200634506A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_TW200634506A3</originalsourceid><addsrcrecordid>eNrjZNAMriwuSc1VSMxLUchNLcnIT1EoyVcoLE3MyUyrVEhJLElUSE4sKCktSuVhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfEh4UYGBmbGJqYGZo7GxKgBAO4AKJ0</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>System and method to qualify data capture</title><source>esp@cenet</source><creator>AKKERMAN, RYAN LEE ; JOHNSON, TYLER J ; BENAVIDES, JOHN A</creator><creatorcontrib>AKKERMAN, RYAN LEE ; JOHNSON, TYLER J ; BENAVIDES, JOHN A</creatorcontrib><description>One disclosed embodiment may comprise a system (10, 120, 300) that includes a qualification system (12, 50, 102, 128) that qualifies data on an associated bus (14, 122, 152, 252, 304) for capture and provides a qualification signal as a function of at least one signal that describes a characteristic of the data on the associated bus (14, 122, 152, 252, 304). A data capture system (16, 132, 250) stores qualified data from the associated bus (14, 122, 152, 252, 304) based on the qualification signal and a trigger signal, the trigger signal defining a capture session.</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20061001&DB=EPODOC&CC=TW&NR=200634506A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20061001&DB=EPODOC&CC=TW&NR=200634506A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>AKKERMAN, RYAN LEE</creatorcontrib><creatorcontrib>JOHNSON, TYLER J</creatorcontrib><creatorcontrib>BENAVIDES, JOHN A</creatorcontrib><title>System and method to qualify data capture</title><description>One disclosed embodiment may comprise a system (10, 120, 300) that includes a qualification system (12, 50, 102, 128) that qualifies data on an associated bus (14, 122, 152, 252, 304) for capture and provides a qualification signal as a function of at least one signal that describes a characteristic of the data on the associated bus (14, 122, 152, 252, 304). A data capture system (16, 132, 250) stores qualified data from the associated bus (14, 122, 152, 252, 304) based on the qualification signal and a trigger signal, the trigger signal defining a capture session.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAMriwuSc1VSMxLUchNLcnIT1EoyVcoLE3MyUyrVEhJLElUSE4sKCktSuVhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfEh4UYGBmbGJqYGZo7GxKgBAO4AKJ0</recordid><startdate>20061001</startdate><enddate>20061001</enddate><creator>AKKERMAN, RYAN LEE</creator><creator>JOHNSON, TYLER J</creator><creator>BENAVIDES, JOHN A</creator><scope>EVB</scope></search><sort><creationdate>20061001</creationdate><title>System and method to qualify data capture</title><author>AKKERMAN, RYAN LEE ; JOHNSON, TYLER J ; BENAVIDES, JOHN A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_TW200634506A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2006</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>AKKERMAN, RYAN LEE</creatorcontrib><creatorcontrib>JOHNSON, TYLER J</creatorcontrib><creatorcontrib>BENAVIDES, JOHN A</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>AKKERMAN, RYAN LEE</au><au>JOHNSON, TYLER J</au><au>BENAVIDES, JOHN A</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>System and method to qualify data capture</title><date>2006-10-01</date><risdate>2006</risdate><abstract>One disclosed embodiment may comprise a system (10, 120, 300) that includes a qualification system (12, 50, 102, 128) that qualifies data on an associated bus (14, 122, 152, 252, 304) for capture and provides a qualification signal as a function of at least one signal that describes a characteristic of the data on the associated bus (14, 122, 152, 252, 304). A data capture system (16, 132, 250) stores qualified data from the associated bus (14, 122, 152, 252, 304) based on the qualification signal and a trigger signal, the trigger signal defining a capture session.</abstract><oa>free_for_read</oa></addata></record>
fulltext	fulltext_linktorsrc
identifier
ispartof
issn
language	chi ; eng
recordid	cdi_epo_espacenet_TW200634506A
source	esp@cenet
subjects	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
title	System and method to qualify data capture
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T13%3A01%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=AKKERMAN,%20RYAN%20LEE&rft.date=2006-10-01&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ETW200634506A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true