Probe testing structure

A calibration structure for probing devices. A calibration substrate for calibrating a probe comprising: (a) a first conductive member supported by said substrate suitable to be electrically interconnected with a first signal path of said probe; (b) a second conductive member supported by said subst...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	LESHER, TIMOTHY E
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE SEMICONDUCTOR DEVICES TESTING WAVEGUIDES
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