Probe testing structure

A calibration structure for probing devices. A calibration substrate for calibrating a probe comprising: (a) a first conductive member supported by said substrate suitable to be electrically interconnected with a first signal path of said probe; (b) a second conductive member supported by said subst...

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Bibliographische Detailangaben
1. Verfasser:	LESHER, TIMOTHY E
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE SEMICONDUCTOR DEVICES TESTING WAVEGUIDES
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Beschreibung
Zusammenfassung:	A calibration structure for probing devices. A calibration substrate for calibrating a probe comprising: (a) a first conductive member supported by said substrate suitable to be electrically interconnected with a first signal path of said probe; (b) a second conductive member supported by said substrate suitable to be electrically interconnected with a second signal path of said probe; (c) a third conductive member supported by said substrate suitable to be electrically interconnected with a ground path of said probe; (d) a fourth conductive member supported by said substrate suitable to be electrically interconnected with a first signal path of another probe; (e) a fifth conductive member supported by said substrate suitable to be electrically interconnected with a second signal path of said another probe; (f) a sixth conductive member supported by said substrate suitable to be electrically interconnected with a ground path of said another probe; (g) wherein said third conductive member and said sixth conduc