METHOD OF OBTAINING IMAGES IN RASTER ELECTRON MICROSCOPE
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| creator | SPIVAK GRIGORIJ V,SU SASOV ALEKSANDR YU,SU RAU EDUARD I,SU |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_SU911651A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>SU911651A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_SU911651A13</originalsourceid><addsrcrecordid>eNrjZLDwdQ3x8HdR8HdT8HcKcfT08_RzV_D0dXR3DVbw9FMIcgwOcQ1ScPVxdQ4J8vdT8PV0DvIPdvYPcOVhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfHBoZaGhmamho6GxoRVAAC9rye4</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD OF OBTAINING IMAGES IN RASTER ELECTRON MICROSCOPE</title><source>esp@cenet</source><creator>SPIVAK GRIGORIJ V,SU ; SASOV ALEKSANDR YU,SU ; RAU EDUARD I,SU</creator><creatorcontrib>SPIVAK GRIGORIJ V,SU ; SASOV ALEKSANDR YU,SU ; RAU EDUARD I,SU</creatorcontrib><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES ; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES ; NANOTECHNOLOGY ; PERFORMING OPERATIONS ; SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES ; TRANSPORTING</subject><creationdate>1982</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19820307&DB=EPODOC&CC=SU&NR=911651A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19820307&DB=EPODOC&CC=SU&NR=911651A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SPIVAK GRIGORIJ V,SU</creatorcontrib><creatorcontrib>SASOV ALEKSANDR YU,SU</creatorcontrib><creatorcontrib>RAU EDUARD I,SU</creatorcontrib><title>METHOD OF OBTAINING IMAGES IN RASTER ELECTRON MICROSCOPE</title><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES</subject><subject>MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES</subject><subject>NANOTECHNOLOGY</subject><subject>PERFORMING OPERATIONS</subject><subject>SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1982</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLDwdQ3x8HdR8HdT8HcKcfT08_RzV_D0dXR3DVbw9FMIcgwOcQ1ScPVxdQ4J8vdT8PV0DvIPdvYPcOVhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfHBoZaGhmamho6GxoRVAAC9rye4</recordid><startdate>19820307</startdate><enddate>19820307</enddate><creator>SPIVAK GRIGORIJ V,SU</creator><creator>SASOV ALEKSANDR YU,SU</creator><creator>RAU EDUARD I,SU</creator><scope>EVB</scope></search><sort><creationdate>19820307</creationdate><title>METHOD OF OBTAINING IMAGES IN RASTER ELECTRON MICROSCOPE</title><author>SPIVAK GRIGORIJ V,SU ; SASOV ALEKSANDR YU,SU ; RAU EDUARD I,SU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_SU911651A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1982</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES</topic><topic>MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES</topic><topic>NANOTECHNOLOGY</topic><topic>PERFORMING OPERATIONS</topic><topic>SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SPIVAK GRIGORIJ V,SU</creatorcontrib><creatorcontrib>SASOV ALEKSANDR YU,SU</creatorcontrib><creatorcontrib>RAU EDUARD I,SU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SPIVAK GRIGORIJ V,SU</au><au>SASOV ALEKSANDR YU,SU</au><au>RAU EDUARD I,SU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD OF OBTAINING IMAGES IN RASTER ELECTRON MICROSCOPE</title><date>1982-03-07</date><risdate>1982</risdate><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY MANUFACTURE OR TREATMENT OF NANOSTRUCTURES MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES NANOTECHNOLOGY PERFORMING OPERATIONS SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES TRANSPORTING |
| title | METHOD OF OBTAINING IMAGES IN RASTER ELECTRON MICROSCOPE |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T01%3A58%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SPIVAK%20GRIGORIJ%20V,SU&rft.date=1982-03-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ESU911651A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |