METHOD OF MEASURING MICROCHANNEL DIAMETERS

METHOD OF MEASURING MICROCHANNEL DIAMETERS

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Hauptverfasser: TITOV IGOR P,SU, ANDREEV SERGEJ V,SU, ABRAMOV VIKTOR ,SU, SEVRYUKOVA NINA ,SU
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator TITOV IGOR P,SU
ANDREEV SERGEJ V,SU
ABRAMOV VIKTOR ,SU
SEVRYUKOVA NINA ,SU
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format Patent
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title METHOD OF MEASURING MICROCHANNEL DIAMETERS
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