SCANNING DEVICE TO FLAW DETECTOR

SCANNING DEVICE TO FLAW DETECTOR

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Hauptverfasser: LISITSYN VADIM S,SU, LAVROV SERGEJ YA,SU, PANOVA VALENTINA P,SU
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator LISITSYN VADIM S,SU
LAVROV SERGEJ YA,SU
PANOVA VALENTINA P,SU
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title SCANNING DEVICE TO FLAW DETECTOR
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