PHOTOELECTRIC APPARATUS FOR QUALITY CONTROL OF ARTICLE SURFACE
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | ALEKSEEV ALEKSANDR P,SU FEDOROVSKIJ VLADIMIR F,SU RUD VIKTOR V,SU YAKHONTOVA TAMARA ,SU |
| description | |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_SU750276A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>SU750276A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_SU750276A13</originalsourceid><addsrcrecordid>eNrjZLAL8PAP8Xf1cXUOCfJ0VnAMCHAMcgwJDVZw8w9SCAx19PEMiVRw9vcLCfL3UfB3U3AMCvF09nFVCA4NcnN0duVhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfHBoeamBkbmZo6GxoRVAADh5SnA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PHOTOELECTRIC APPARATUS FOR QUALITY CONTROL OF ARTICLE SURFACE</title><source>esp@cenet</source><creator>ALEKSEEV ALEKSANDR P,SU ; FEDOROVSKIJ VLADIMIR F,SU ; RUD VIKTOR V,SU ; YAKHONTOVA TAMARA ,SU</creator><creatorcontrib>ALEKSEEV ALEKSANDR P,SU ; FEDOROVSKIJ VLADIMIR F,SU ; RUD VIKTOR V,SU ; YAKHONTOVA TAMARA ,SU</creatorcontrib><language>eng</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>1980</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19800723&DB=EPODOC&CC=SU&NR=750276A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19800723&DB=EPODOC&CC=SU&NR=750276A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ALEKSEEV ALEKSANDR P,SU</creatorcontrib><creatorcontrib>FEDOROVSKIJ VLADIMIR F,SU</creatorcontrib><creatorcontrib>RUD VIKTOR V,SU</creatorcontrib><creatorcontrib>YAKHONTOVA TAMARA ,SU</creatorcontrib><title>PHOTOELECTRIC APPARATUS FOR QUALITY CONTROL OF ARTICLE SURFACE</title><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1980</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAL8PAP8Xf1cXUOCfJ0VnAMCHAMcgwJDVZw8w9SCAx19PEMiVRw9vcLCfL3UfB3U3AMCvF09nFVCA4NcnN0duVhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfHBoeamBkbmZo6GxoRVAADh5SnA</recordid><startdate>19800723</startdate><enddate>19800723</enddate><creator>ALEKSEEV ALEKSANDR P,SU</creator><creator>FEDOROVSKIJ VLADIMIR F,SU</creator><creator>RUD VIKTOR V,SU</creator><creator>YAKHONTOVA TAMARA ,SU</creator><scope>EVB</scope></search><sort><creationdate>19800723</creationdate><title>PHOTOELECTRIC APPARATUS FOR QUALITY CONTROL OF ARTICLE SURFACE</title><author>ALEKSEEV ALEKSANDR P,SU ; FEDOROVSKIJ VLADIMIR F,SU ; RUD VIKTOR V,SU ; YAKHONTOVA TAMARA ,SU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_SU750276A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1980</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ALEKSEEV ALEKSANDR P,SU</creatorcontrib><creatorcontrib>FEDOROVSKIJ VLADIMIR F,SU</creatorcontrib><creatorcontrib>RUD VIKTOR V,SU</creatorcontrib><creatorcontrib>YAKHONTOVA TAMARA ,SU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ALEKSEEV ALEKSANDR P,SU</au><au>FEDOROVSKIJ VLADIMIR F,SU</au><au>RUD VIKTOR V,SU</au><au>YAKHONTOVA TAMARA ,SU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PHOTOELECTRIC APPARATUS FOR QUALITY CONTROL OF ARTICLE SURFACE</title><date>1980-07-23</date><risdate>1980</risdate><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_SU750276A1 |
| source | esp@cenet |
| subjects | MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | PHOTOELECTRIC APPARATUS FOR QUALITY CONTROL OF ARTICLE SURFACE |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T14%3A05%3A50IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ALEKSEEV%20ALEKSANDR%20P,SU&rft.date=1980-07-23&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ESU750276A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |