DEVICE FOR ANALYSIS OF THIN-LAYER RADIOCHROMATOGRAMS AND RADIOELECTROPHOREGRAMS

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: PESHCHEKHONOV VLADIMIR D,SU, ZANEVSKIJ YURIJ V,SU, KAMINIR LEV B,SU, SENCHENKOV EVGENIJ P,SU, CHERNENKO SERGEJ P,SU, KALININ VADIM N,SU, IVANOV ANDREJ B,SU, TYAPKIN IGOR A,SU
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator PESHCHEKHONOV VLADIMIR D,SU
ZANEVSKIJ YURIJ V,SU
KAMINIR LEV B,SU
SENCHENKOV EVGENIJ P,SU
CHERNENKO SERGEJ P,SU
KALININ VADIM N,SU
IVANOV ANDREJ B,SU
TYAPKIN IGOR A,SU
description
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_SU624162A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>SU624162A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_SU624162A13</originalsourceid><addsrcrecordid>eNrjZPB3cQ3zdHZVcPMPUnD0c_SJDPYMVvB3Uwjx8PTT9XGMdA1SCHJ08fR39gjy93UM8XcPcvQNBqp0gQi7-rg6hwT5B3j4B7mCpXgYWNMSc4pTeaE0N4O8m2uIs4duakF-fGpxQWJyal5qSXxwqJmRiaGZkaOhMWEVAKutLmc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DEVICE FOR ANALYSIS OF THIN-LAYER RADIOCHROMATOGRAMS AND RADIOELECTROPHOREGRAMS</title><source>esp@cenet</source><creator>PESHCHEKHONOV VLADIMIR D,SU ; ZANEVSKIJ YURIJ V,SU ; KAMINIR LEV B,SU ; SENCHENKOV EVGENIJ P,SU ; CHERNENKO SERGEJ P,SU ; KALININ VADIM N,SU ; IVANOV ANDREJ B,SU ; TYAPKIN IGOR A,SU</creator><creatorcontrib>PESHCHEKHONOV VLADIMIR D,SU ; ZANEVSKIJ YURIJ V,SU ; KAMINIR LEV B,SU ; SENCHENKOV EVGENIJ P,SU ; CHERNENKO SERGEJ P,SU ; KALININ VADIM N,SU ; IVANOV ANDREJ B,SU ; TYAPKIN IGOR A,SU</creatorcontrib><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1978</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19780915&amp;DB=EPODOC&amp;CC=SU&amp;NR=624162A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76304</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19780915&amp;DB=EPODOC&amp;CC=SU&amp;NR=624162A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>PESHCHEKHONOV VLADIMIR D,SU</creatorcontrib><creatorcontrib>ZANEVSKIJ YURIJ V,SU</creatorcontrib><creatorcontrib>KAMINIR LEV B,SU</creatorcontrib><creatorcontrib>SENCHENKOV EVGENIJ P,SU</creatorcontrib><creatorcontrib>CHERNENKO SERGEJ P,SU</creatorcontrib><creatorcontrib>KALININ VADIM N,SU</creatorcontrib><creatorcontrib>IVANOV ANDREJ B,SU</creatorcontrib><creatorcontrib>TYAPKIN IGOR A,SU</creatorcontrib><title>DEVICE FOR ANALYSIS OF THIN-LAYER RADIOCHROMATOGRAMS AND RADIOELECTROPHOREGRAMS</title><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1978</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPB3cQ3zdHZVcPMPUnD0c_SJDPYMVvB3Uwjx8PTT9XGMdA1SCHJ08fR39gjy93UM8XcPcvQNBqp0gQi7-rg6hwT5B3j4B7mCpXgYWNMSc4pTeaE0N4O8m2uIs4duakF-fGpxQWJyal5qSXxwqJmRiaGZkaOhMWEVAKutLmc</recordid><startdate>19780915</startdate><enddate>19780915</enddate><creator>PESHCHEKHONOV VLADIMIR D,SU</creator><creator>ZANEVSKIJ YURIJ V,SU</creator><creator>KAMINIR LEV B,SU</creator><creator>SENCHENKOV EVGENIJ P,SU</creator><creator>CHERNENKO SERGEJ P,SU</creator><creator>KALININ VADIM N,SU</creator><creator>IVANOV ANDREJ B,SU</creator><creator>TYAPKIN IGOR A,SU</creator><scope>EVB</scope></search><sort><creationdate>19780915</creationdate><title>DEVICE FOR ANALYSIS OF THIN-LAYER RADIOCHROMATOGRAMS AND RADIOELECTROPHOREGRAMS</title><author>PESHCHEKHONOV VLADIMIR D,SU ; ZANEVSKIJ YURIJ V,SU ; KAMINIR LEV B,SU ; SENCHENKOV EVGENIJ P,SU ; CHERNENKO SERGEJ P,SU ; KALININ VADIM N,SU ; IVANOV ANDREJ B,SU ; TYAPKIN IGOR A,SU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_SU624162A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1978</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>PESHCHEKHONOV VLADIMIR D,SU</creatorcontrib><creatorcontrib>ZANEVSKIJ YURIJ V,SU</creatorcontrib><creatorcontrib>KAMINIR LEV B,SU</creatorcontrib><creatorcontrib>SENCHENKOV EVGENIJ P,SU</creatorcontrib><creatorcontrib>CHERNENKO SERGEJ P,SU</creatorcontrib><creatorcontrib>KALININ VADIM N,SU</creatorcontrib><creatorcontrib>IVANOV ANDREJ B,SU</creatorcontrib><creatorcontrib>TYAPKIN IGOR A,SU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PESHCHEKHONOV VLADIMIR D,SU</au><au>ZANEVSKIJ YURIJ V,SU</au><au>KAMINIR LEV B,SU</au><au>SENCHENKOV EVGENIJ P,SU</au><au>CHERNENKO SERGEJ P,SU</au><au>KALININ VADIM N,SU</au><au>IVANOV ANDREJ B,SU</au><au>TYAPKIN IGOR A,SU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DEVICE FOR ANALYSIS OF THIN-LAYER RADIOCHROMATOGRAMS AND RADIOELECTROPHOREGRAMS</title><date>1978-09-15</date><risdate>1978</risdate><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_SU624162A1
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title DEVICE FOR ANALYSIS OF THIN-LAYER RADIOCHROMATOGRAMS AND RADIOELECTROPHOREGRAMS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T12%3A31%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=PESHCHEKHONOV%20VLADIMIR%20D,SU&rft.date=1978-09-15&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ESU624162A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true