EDDY-CYRRENT FLAW DETECTOR

Bibliographische Detailangaben

Hauptverfasser:	CHERNYSHEV ALEKSEJ V,SU, KRICHEVSKIJ EVGENIJ M,SU, GUSAK NIKOLAJ O,SU, ZATSEPIN NIKOLAJ N,SU, LAMIN ALEKSANDR B,SU, CHEKANOV LEV M,SU
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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