METHOD FOR RECORDING DOUBLE EXPOSURE HOLOGRAPHIC INTERFERENCE PATTERN

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: TYUSHKEVICH BORIS N,SU, NIZHNIK MIKHAIL N,SU
Format: Patent
Sprache:eng ; rus
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator TYUSHKEVICH BORIS N,SU
NIZHNIK MIKHAIL N,SU
description
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_SU1636686A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>SU1636686A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_SU1636686A13</originalsourceid><addsrcrecordid>eNrjZHD1dQ3x8HdRcPMPUghydfYPcvH0c1dw8Q918nFVcI0I8A8ODXJV8PD38XcPcgzw8HRW8PQLcQ1ycw1y9XN2VQhwDAHy_HgYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSXxwqKGZsZmZhZmjoTERSgBSbywl</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD FOR RECORDING DOUBLE EXPOSURE HOLOGRAPHIC INTERFERENCE PATTERN</title><source>esp@cenet</source><creator>TYUSHKEVICH BORIS N,SU ; NIZHNIK MIKHAIL N,SU</creator><creatorcontrib>TYUSHKEVICH BORIS N,SU ; NIZHNIK MIKHAIL N,SU</creatorcontrib><language>eng ; rus</language><subject>CINEMATOGRAPHY ; ELECTROGRAPHY ; HOLOGRAPHIC PROCESSES OR APPARATUS ; HOLOGRAPHY ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHOTOGRAPHY ; PHYSICS ; TESTING</subject><creationdate>1991</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19910323&amp;DB=EPODOC&amp;CC=SU&amp;NR=1636686A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19910323&amp;DB=EPODOC&amp;CC=SU&amp;NR=1636686A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TYUSHKEVICH BORIS N,SU</creatorcontrib><creatorcontrib>NIZHNIK MIKHAIL N,SU</creatorcontrib><title>METHOD FOR RECORDING DOUBLE EXPOSURE HOLOGRAPHIC INTERFERENCE PATTERN</title><subject>CINEMATOGRAPHY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHIC PROCESSES OR APPARATUS</subject><subject>HOLOGRAPHY</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHOTOGRAPHY</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1991</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHD1dQ3x8HdRcPMPUghydfYPcvH0c1dw8Q918nFVcI0I8A8ODXJV8PD38XcPcgzw8HRW8PQLcQ1ycw1y9XN2VQhwDAHy_HgYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSXxwqKGZsZmZhZmjoTERSgBSbywl</recordid><startdate>19910323</startdate><enddate>19910323</enddate><creator>TYUSHKEVICH BORIS N,SU</creator><creator>NIZHNIK MIKHAIL N,SU</creator><scope>EVB</scope></search><sort><creationdate>19910323</creationdate><title>METHOD FOR RECORDING DOUBLE EXPOSURE HOLOGRAPHIC INTERFERENCE PATTERN</title><author>TYUSHKEVICH BORIS N,SU ; NIZHNIK MIKHAIL N,SU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_SU1636686A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; rus</language><creationdate>1991</creationdate><topic>CINEMATOGRAPHY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHIC PROCESSES OR APPARATUS</topic><topic>HOLOGRAPHY</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHOTOGRAPHY</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TYUSHKEVICH BORIS N,SU</creatorcontrib><creatorcontrib>NIZHNIK MIKHAIL N,SU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TYUSHKEVICH BORIS N,SU</au><au>NIZHNIK MIKHAIL N,SU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD FOR RECORDING DOUBLE EXPOSURE HOLOGRAPHIC INTERFERENCE PATTERN</title><date>1991-03-23</date><risdate>1991</risdate><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; rus
recordid cdi_epo_espacenet_SU1636686A1
source esp@cenet
subjects CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHIC PROCESSES OR APPARATUS
HOLOGRAPHY
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHOTOGRAPHY
PHYSICS
TESTING
title METHOD FOR RECORDING DOUBLE EXPOSURE HOLOGRAPHIC INTERFERENCE PATTERN
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T11%3A16%3A07IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=TYUSHKEVICH%20BORIS%20N,SU&rft.date=1991-03-23&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ESU1636686A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true