METHOD OF MEASURING THICKNESS OF LAYERS OF LAMINATED FILMS

METHOD OF MEASURING THICKNESS OF LAYERS OF LAMINATED FILMS

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: USIK VASILIJ N,SU, MARKOV PETR I,SU, VOROBEV OLEG M,SU, KATS ALEKSANDR I,SU
Format: Patent
Sprache:eng ; rus
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator USIK VASILIJ N,SU
MARKOV PETR I,SU
VOROBEV OLEG M,SU
KATS ALEKSANDR I,SU
description
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_SU1566204A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>SU1566204A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_SU1566204A13</originalsourceid><addsrcrecordid>eNrjZLDydQ3x8HdR8HdT8HV1DA4N8vRzVwjx8HT29nMNDgYJ-zhGugZBWb6efo4hri4Kbp4-vsE8DKxpiTnFqbxQmptBwc01xNlDN7UgPz61uCAxOTUvtSQ-ONTQ1MzMyMDE0dCYCCUAVX0okA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD OF MEASURING THICKNESS OF LAYERS OF LAMINATED FILMS</title><source>esp@cenet</source><creator>USIK VASILIJ N,SU ; MARKOV PETR I,SU ; VOROBEV OLEG M,SU ; KATS ALEKSANDR I,SU</creator><creatorcontrib>USIK VASILIJ N,SU ; MARKOV PETR I,SU ; VOROBEV OLEG M,SU ; KATS ALEKSANDR I,SU</creatorcontrib><language>eng ; rus</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>1990</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19900523&amp;DB=EPODOC&amp;CC=SU&amp;NR=1566204A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19900523&amp;DB=EPODOC&amp;CC=SU&amp;NR=1566204A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>USIK VASILIJ N,SU</creatorcontrib><creatorcontrib>MARKOV PETR I,SU</creatorcontrib><creatorcontrib>VOROBEV OLEG M,SU</creatorcontrib><creatorcontrib>KATS ALEKSANDR I,SU</creatorcontrib><title>METHOD OF MEASURING THICKNESS OF LAYERS OF LAMINATED FILMS</title><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1990</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLDydQ3x8HdR8HdT8HV1DA4N8vRzVwjx8HT29nMNDgYJ-zhGugZBWb6efo4hri4Kbp4-vsE8DKxpiTnFqbxQmptBwc01xNlDN7UgPz61uCAxOTUvtSQ-ONTQ1MzMyMDE0dCYCCUAVX0okA</recordid><startdate>19900523</startdate><enddate>19900523</enddate><creator>USIK VASILIJ N,SU</creator><creator>MARKOV PETR I,SU</creator><creator>VOROBEV OLEG M,SU</creator><creator>KATS ALEKSANDR I,SU</creator><scope>EVB</scope></search><sort><creationdate>19900523</creationdate><title>METHOD OF MEASURING THICKNESS OF LAYERS OF LAMINATED FILMS</title><author>USIK VASILIJ N,SU ; MARKOV PETR I,SU ; VOROBEV OLEG M,SU ; KATS ALEKSANDR I,SU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_SU1566204A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; rus</language><creationdate>1990</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>USIK VASILIJ N,SU</creatorcontrib><creatorcontrib>MARKOV PETR I,SU</creatorcontrib><creatorcontrib>VOROBEV OLEG M,SU</creatorcontrib><creatorcontrib>KATS ALEKSANDR I,SU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>USIK VASILIJ N,SU</au><au>MARKOV PETR I,SU</au><au>VOROBEV OLEG M,SU</au><au>KATS ALEKSANDR I,SU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD OF MEASURING THICKNESS OF LAYERS OF LAMINATED FILMS</title><date>1990-05-23</date><risdate>1990</risdate><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; rus
recordid cdi_epo_espacenet_SU1566204A1
source esp@cenet
subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title METHOD OF MEASURING THICKNESS OF LAYERS OF LAMINATED FILMS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-02T15%3A31%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=USIK%20VASILIJ%20N,SU&rft.date=1990-05-23&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3ESU1566204A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true